Actas de congresos
Analysis Of Polyaniline Films Using Atomic Force Microscopy
Registro en:
Molecular Crystals And Liquid Crystals Science And Technology Section A: Molecular Crystals And Liquid Crystals. , v. 374, n. , p. 191 - 200, 2002.
1058725X
10.1080/10587250210487
2-s2.0-11144303476
Autor
Pereira-Da-Silva M.A.
Balogh D.T.
Eiras C.
Kleinke M.U.
Faria R.M.
Institución
Resumen
This work presents a morphological study of polyaniline (PANI) films, chemically and electrochemically synthesised over ITO (Indium Tin Oxide covered glass) substratum using atomic force microscopy (AFM). From AFM images we calculate the fractal dimension of the polyaniline formed films using power spectral density (PSD) and the box counting method (roughness versus scale). As a result it is shown that the fractality obtained by PSD are in good agreement with box counting. 374
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