dc.creatorPereira-Da-Silva M.A.
dc.creatorBalogh D.T.
dc.creatorEiras C.
dc.creatorKleinke M.U.
dc.creatorFaria R.M.
dc.date2002
dc.date2015-06-30T16:44:46Z
dc.date2015-11-26T15:37:10Z
dc.date2015-06-30T16:44:46Z
dc.date2015-11-26T15:37:10Z
dc.date.accessioned2018-03-28T22:45:37Z
dc.date.available2018-03-28T22:45:37Z
dc.identifier
dc.identifierMolecular Crystals And Liquid Crystals Science And Technology Section A: Molecular Crystals And Liquid Crystals. , v. 374, n. , p. 191 - 200, 2002.
dc.identifier1058725X
dc.identifier10.1080/10587250210487
dc.identifierhttp://www.scopus.com/inward/record.url?eid=2-s2.0-11144303476&partnerID=40&md5=a9a644e612a47fbe169db38d505098b5
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/101887
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/101887
dc.identifier2-s2.0-11144303476
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1263589
dc.descriptionThis work presents a morphological study of polyaniline (PANI) films, chemically and electrochemically synthesised over ITO (Indium Tin Oxide covered glass) substratum using atomic force microscopy (AFM). From AFM images we calculate the fractal dimension of the polyaniline formed films using power spectral density (PSD) and the box counting method (roughness versus scale). As a result it is shown that the fractality obtained by PSD are in good agreement with box counting.
dc.description374
dc.description
dc.description191
dc.description200
dc.descriptionGonzalez, R.G., Wintz, P., (1987) Digital Image Processus, , Addison-Wesley, Reading
dc.descriptionVatel, O., Dumas, P., Chollet, F., Salvan, F., André, E., Roughness assessment of polysilicon using power spectral density (1993) Jpn. J. Appl. Phys., 32, p. 5671
dc.descriptionMitchell, M.W., Bonnel, D.A., Quantitative topographic analysis of fractal surfaces by scanning tunneling microscopy (1990) J. Mater. Res., 5 (10), p. 2244
dc.descriptionMandelbrot, B.B., (1983) The Fractal Geometry of Nature, , W. H. Freeman and Company, New York
dc.descriptionMandelbrot, B.B., (1977) Fractals Form, Chance, and Dimension, , W. H. Freeman and Company, San Francisco
dc.descriptionMandelbrot, B.B., Passoja, D.E., Paullay, A.J., Fractal character of fracture surfaces of metals (1984) Letters to Nature, 308, p. 721
dc.descriptionVatel, O., Dumas, P., Chollet, F., Salvan, F., Andre, E., Roughness assessment of polysilicon using power spectral density (1993) Jpn. J. Appl. Phys., 32, p. 5671
dc.descriptionBarabási, A.L., Stanley, H.E., (1995) Fractal Concepts in Surface Growth, , Cambridge, Cambridge University Press
dc.descriptionRuss, J.C., (1994) Fractal Surfaces, , Plenum Press, New York and London
dc.descriptionKiely, J.D., Bonneli, D.A., Quantification of topographic structure by scanning probe microscopy (1997) J. Vac. Sci. Technol. B, 15 (4), p. 1483
dc.languageen
dc.publisher
dc.relationMolecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals
dc.rightsfechado
dc.sourceScopus
dc.titleAnalysis Of Polyaniline Films Using Atomic Force Microscopy
dc.typeActas de congresos


Este ítem pertenece a la siguiente institución