Artículos de revistas
A Method For The Determination Of The Complex Refractive Index Of Non-metallic Thin Films Using Photometric Measurements At Normal Incidence
Registro en:
Thin Solid Films. , v. 100, n. 2, p. 155 - 168, 1983.
406090
10.1016/0040-6090(83)90471-6
2-s2.0-0020708713
Autor
Cisneros J.I.
Rego G.B.
Tomyiama M.
Bilac S.
Goncalves J.M.
Rodriguez A.E.
Arguello Z.P.
Institución
Resumen
A method is proposed for the determination of the complex refractive index of non-metallic thin films using photometric measurements at normal incidence over an extended wavelength interval. A necessary condition for the applicability of the method is the existence of maxima and minima in the reflectance due to interference effects. The problem of multiple solutions is analysed and the optical thicknesses at the extrema are used for choosing the correct solutions. For absorbing films two alternative procedures are described. One procedure requires an approximate value of the film thickness to start with and refines it during the calculation. The other procedure does not depend on a previous knowledge of the thickness but gives it as a result together with n(λ) and k(λ). A separate procedure is proposed for transparent and almost transparent films. An application of the method is carried out in which excellent agreement is obtained between calculated and experimental results. © 1983. 100 2 155 168 Heavens, (1964) Phys. Thin Films, 2, pp. 193-238 Abelès, Optical Properties of Metallic Films (1971) Phys. Thin Films, 6, pp. 151-204 Malé, (1950) C.R. Acad. Sci., 230, p. 1349 Malé, (1954) Ann. Phys. (Paris), 9, p. 10 Malé, Détermination simultanée des indices et de l'épaisseur des couches minces absorbantes (1964) Journal de Physique, 25, p. 74 Hall, Jr., Ferguson, Optical Properties of Cadmium Sulfide and Zinc Sulfide from 06 Micron to 14 Microns (1955) Journal of the Optical Society of America, 45, p. 714 Goodman, (1978) Appl. Opt., 17, p. 2779 Nilsson, Determination of Optical Constants from Intensity Measurements at Normal Incidence (1968) Applied Optics, 7, p. 435 Abelès, Thèye, Méthode de calcul des constantes optiques des couches minces absorbantes à partir de mesures de réflexion et de transmission (1966) Surface Science, 5, p. 325 Denton, Campbell, Tomlin, (1972) J. Phys. D, 5, p. 852 Ward, Nag, Dixon, (1969) J. Phys. D, 2, p. 301 Ward, Nag, (1970) J. Phys. D, 3, p. 462 Cook, Christy, (1980) J. Appl. Phys., 51, p. 668 Carey, Thomas, Newman, (1980) Thin Solid Films, 66, p. 139 Born, Wolf, (1975) Principles of Optics, pp. 61-66. , 5th edn., Pergamon, New York Born, Wolf, (1975) Principles of Optics, pp. 628-632. , 5th edn., Pergamon, New York Knittl, (1976) Optics of Thin Films, pp. 480-484. , Wiley, New York Bringans, (1977) J. Phys. D, 10, p. 1855 Bennet, Booty, Computational Method for Determining n and k for a Thin Film from the Measured Reflectance, Transmittance, and Film Thickness (1966) Applied Optics, 5, p. 41