A Method For The Determination Of The Complex Refractive Index Of Non-metallic Thin Films Using Photometric Measurements At Normal Incidence

dc.creatorCisneros J.I.
dc.creatorRego G.B.
dc.creatorTomyiama M.
dc.creatorBilac S.
dc.creatorGoncalves J.M.
dc.creatorRodriguez A.E.
dc.creatorArguello Z.P.
dc.date1983
dc.date2015-06-30T13:43:33Z
dc.date2015-11-26T14:38:39Z
dc.date2015-06-30T13:43:33Z
dc.date2015-11-26T14:38:39Z
dc.date.accessioned2018-03-28T21:43:51Z
dc.date.available2018-03-28T21:43:51Z
dc.identifier
dc.identifierThin Solid Films. , v. 100, n. 2, p. 155 - 168, 1983.
dc.identifier406090
dc.identifier10.1016/0040-6090(83)90471-6
dc.identifierhttp://www.scopus.com/inward/record.url?eid=2-s2.0-0020708713&partnerID=40&md5=80d83539842cfe388a6cce2a12dc3a51
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/98688
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/98688
dc.identifier2-s2.0-0020708713
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1249675
dc.descriptionA method is proposed for the determination of the complex refractive index of non-metallic thin films using photometric measurements at normal incidence over an extended wavelength interval. A necessary condition for the applicability of the method is the existence of maxima and minima in the reflectance due to interference effects. The problem of multiple solutions is analysed and the optical thicknesses at the extrema are used for choosing the correct solutions. For absorbing films two alternative procedures are described. One procedure requires an approximate value of the film thickness to start with and refines it during the calculation. The other procedure does not depend on a previous knowledge of the thickness but gives it as a result together with n(λ) and k(λ). A separate procedure is proposed for transparent and almost transparent films. An application of the method is carried out in which excellent agreement is obtained between calculated and experimental results. © 1983.
dc.description100
dc.description2
dc.description155
dc.description168
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dc.languageen
dc.publisher
dc.relationThin Solid Films
dc.rightsfechado
dc.sourceScopus
dc.titleA Method For The Determination Of The Complex Refractive Index Of Non-metallic Thin Films Using Photometric Measurements At Normal Incidence
dc.typeArtículos de revistas


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