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Second-order statistics for diversity-combining, techniques in Nakagami-fading channels
(Institute of Electrical and Electronics Engineers (IEEE), 2001-11-01)
Exact and closed-form expressions for the level crossing rate and average fade duration are presented for the M branch pure selection combining (PSC), equal gain combining (EGC), and maximal ratio combining (MRC) techniques, ...
Second-order statistics for diversity-combining, techniques in Nakagami-fading channels
(Institute of Electrical and Electronics Engineers (IEEE), 2001-11-01)
Exact and closed-form expressions for the level crossing rate and average fade duration are presented for the M branch pure selection combining (PSC), equal gain combining (EGC), and maximal ratio combining (MRC) techniques, ...
On the Simulation and Correlation Properties of Phase-Envelope Nakagami Fading Processes
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2009)
A simple accurate method for generating autocorrelated Nakagami-m envelope sequences
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2007)
On the Second-Order Statistics of Nakagami Fading Simulators
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2009)
The RM2 Nakagami Fading Channel Simulator
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2013)
The Multivariate alpha-mu Distribution
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2010)
Second-order statistics for diversity-combining, techniques in Nakagami-fading channels
(Institute of Electrical and Electronics Engineers (IEEE), 2014)
Second-order statistics for diversity-combining, techniques in Nakagami-fading channels
(Ieee-inst Electrical Electronics Engineers IncNew YorkEUA, 2001)
The kappa-mu distribution and the eta-mu distribution
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2007)