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Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
(2017-03-23)
The fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various ...
Charge density alterations in human hair fibers: An investigation using electrostatic force microscopy
(2006-04-01)
A new method for high-resolution analyses of hair surface charge density under ambient conditions is presented in this paper. Electrostatic force microscopy (EFM) is used here to analyze changes in surface charge density ...
Charge density alterations in human hair fibers: An investigation using electrostatic force microscopy
(2006-04-01)
A new method for high-resolution analyses of hair surface charge density under ambient conditions is presented in this paper. Electrostatic force microscopy (EFM) is used here to analyze changes in surface charge density ...
Charge density alterations in human hair fibers: an investigation using electrostatic force microscopy
(Society of Cosmetic Scientists and the Société Française de Cosmétologie, 2021)
Structural, atomic and electrostatic force microscopy analyses on YBCO/PBCO/LCMO superlattices
(2017-07-01)
In order to study the influence of the insulator layer thickness in heterojunctions, (YBa2Cu3O7-d[20nm]/ PrBa2Cu3Oy/La1/3Ca2/3MnO3[20nm])x20 superlattices were prepared by pulsed laser deposition using three PrBa2Cu3Oy ...
Degradation analysis of the SnO2 and ZnO-based varistors using electrostatic force microscopy
(2013-06-01)
The degradation phenomena of ZnO and SnO2-based varistors were investigated for two different degradation methods: DC voltage at increased temperature and degradation with 8/20 μs pulsed currents (lightning type). Electrostatic ...
Degradation analysis of the SnO2 and ZnO-based varistors using electrostatic force microscopy
(2013-06-01)
The degradation phenomena of ZnO and SnO2-based varistors were investigated for two different degradation methods: DC voltage at increased temperature and degradation with 8/20 μs pulsed currents (lightning type). Electrostatic ...
Electrostatic force microscopy as a tool to estimate the number of active potential barriers in dense non-Ohmic polycrystalline SnO2 devices
(American Institute of Physics (AIP), 2006-10-09)
In the present work, electroactive grain boundaries of highly dense metal oxide SnO2-based polycrystalline varistors were determined by electrostatic force microscopy (EFM). The EFM technique was applied to identify ...