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Theoretical models for surface forces and adhesion and their measurement using atomic force microscopy
(MDPI AGBasel, 2012-10)
The increasing importance of studies on soft matter and their impact on new technologies, including those associated with nanotechnology, has brought intermolecular and surface forces to the forefront of physics and materials ...
Theoretical Models for Surface Forces and Adhesion and Their Measurement Using Atomic Force Microscopy
(Mdpi Ag, 2012-10-01)
The increasing importance of studies on soft matter and their impact on new technologies, including those associated with nanotechnology, has brought intermolecular and surface forces to the forefront of physics and materials ...
Theoretical Models for Surface Forces and Adhesion and Their Measurement Using Atomic Force Microscopy
(Mdpi Ag, 2012-10-01)
The increasing importance of studies on soft matter and their impact on new technologies, including those associated with nanotechnology, has brought intermolecular and surface forces to the forefront of physics and materials ...
Mapping of adhesion forces on soil minerals in air and water by atomic force spectroscopy (AFS)
(Vsp Bv, 2003-01-01)
The adhesion force between an atomic force microscope (AFM) tip and sample surfaces, mica and quartz substrates, was measured in air and water. The force curves show that the adhesion has a strong dependence on both the ...
Mapping of adhesion forces on soil minerals in air and water by atomic force spectroscopy (AFS)
(Vsp Bv, 2003-01-01)
The adhesion force between an atomic force microscope (AFM) tip and sample surfaces, mica and quartz substrates, was measured in air and water. The force curves show that the adhesion has a strong dependence on both the ...
Forced oscillations with continuum models of atomic force microscopy
(2012-12-01)
The dynamics of the AFM-atomic force microscope follows a model based in a Timoshenko cantilever beam with a tip attached at the free end and acting with the surface of a sample. General boundary conditions arise when the ...
Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
(2017-03-23)
The fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various ...