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Measuring technical efficiency : a comparison of alternative methodologies with census data
(Pontificia Universidad Católica de Chile, Instituto de Economía., 1983)
Analytical characterization and modeling of shielded test structures for RF-CMOS
(World Scientific Publishing Company, 2008)
Analytical characterization and modeling of shielded test structures for RF-CMOS
(World Scientific Publishing Company, 2008)
Analytical characterization and modeling of shielded test structures for RF-CMOS
(World Scientific Publishing Company, 2008)