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Determination of thickness and optical constants of amorphous silicon films from transmittance data
(Amer Inst PhysicsMelvilleEUA, 2000)
Exponential depletion of neutral dangling bonds density (D-0) by rare-earth doping in amorphous Si films
(ELSEVIER SCIENCE BVAMSTERDAM, 2013-08-02)
In this work we study the effect reduction in the density of dangling bond species D-0 states in rare-earth (RE) doped a-Si films as a function concentration for different RE-specimens. The films a-Si-1_(x) REx, RE=Y3+, ...
Exponential depletion of neutral dangling bonds density (D-0) by rare-earth doping in amorphous Si films
(ElsevierAmsterdam, 2012)
Photoluminescence in amorphous (PbLa)TiO3 thin films deposited on different substrates
(Elsevier B.V., 2014)
Diffraction gratings fabricated in DLC thin films
(ELSEVIER SCIENCE SA, 2010)
This work presents the fabrication of two-dimensional diffraction gratings in diamond-like carbon (DLC) thin films, with applications in computer-generated holography and micro optics. In order to achieve high diffraction ...