dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorLima, Roberto R.
dc.creatorHernandez, Leonardo F.
dc.creatorPecoraro, Édison
dc.creatorRosim-fachini, Estevão
dc.creatorDa Silva, Maria L.P.
dc.date2015-05-15T13:30:24Z
dc.date2016-10-25T20:48:41Z
dc.date2015-05-15T13:30:24Z
dc.date2016-10-25T20:48:41Z
dc.date2012
dc.date.accessioned2017-04-06T08:17:07Z
dc.date.available2017-04-06T08:17:07Z
dc.identifierMaterials Science Forum, v. 730-732, p. 289-294, 2012.
dc.identifier1662-9752
dc.identifierhttp://hdl.handle.net/11449/123549
dc.identifierhttp://acervodigital.unesp.br/handle/11449/123549
dc.identifierhttp://dx.doi.org/10.4028/www.scientific.net/MSF.730-732.289
dc.identifier0528258491277437
dc.identifier8720313833237172
dc.identifierhttp://www.scientific.net/MSF.730-732.289
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/934160
dc.descriptionThis work evaluates fluorinated thin films and their composites for sensor development. Composites were produced using 5 µm starch particles and plasma films obtained from organic fluorinated and silicon compounds reactants. Silicon wafers and aluminum trenches were used as substrates. Film thickness, refractive index and chemical structure were also determined. Scanning electron microscopy shows conformal deposition on aluminum trenches. Films deposited on silicon were exposed to vapor of volatile organic compounds and CV curves were obtained. A qualitative model (FemLab 3.2® program) was proposed for the electronic behavior. These environmentally correct films can be used in electronic devices and preferentially reacted to polar compounds. Nonetheless, due to the difficulty in signal recovery, these films are more effective in one-way sensors, in sub-ppm range.
dc.languageeng
dc.relationMaterials Science Forum
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectComposite
dc.subjectElectrical characterization
dc.subjectPlasma
dc.subjectSensitive layer
dc.titleComposite Material Sensitive to Volatile Organic Compounds
dc.typeOtro


Este ítem pertenece a la siguiente institución