| dc.creator | GONCALVES, JOSEMARY A.C. | |
| dc.creator | MANGIAROTTI, ALESSIO | |
| dc.creator | BUENO, CARMEN C. | |
| dc.date | 2020 | |
| dc.date | 2020-10-13T19:51:27Z | |
| dc.date | 2020-10-13T19:51:27Z | |
| dc.date.accessioned | 2023-09-28T14:16:20Z | |
| dc.date.available | 2023-09-28T14:16:20Z | |
| dc.identifier | 0969-806X | |
| dc.identifier | http://repositorio.ipen.br/handle/123456789/31430 | |
| dc.identifier | 167 | |
| dc.identifier | 10.1016/j.radphyschem.2019.04.026 | |
| dc.identifier | 66.43 | |
| dc.identifier | 72.00 | |
| dc.identifier.uri | https://repositorioslatinoamericanos.uchile.cl/handle/2250/9001653 | |
| dc.description | This work investigates the on-line response of a thin diode, for monitoring low dose radiation processing, with
respect to the linearity between current and dose-rate, the most interesting part being the variation of the current
sensitivity with the accumulated dose. The results obtained indicate that the current response of this diode is
linear and quite stable with repeatability better than 0.2% and a slight decay of 5% of the current sensitivity
(0.28 nA h/Gy) for doses up to 15 kGy. In an attempt to give theoretical support to these results, the radiation
induced current is calculated as a function of the dose rate assuming the diode to be thin as compared with the
standard values of the minority carrier diffusion lengths in intrinsic silicon. Agreement within 2% is found
between calculations and experimental data. | |
| dc.description | Instituto de Pesquisas Energ??ticas e Nucleares (IPEN) | |
| dc.description | Conselho Nacional de Desenvolvimento Cient??fico e Tecnol??gico (CNPq) | |
| dc.description | IPEN: 04/2017 | |
| dc.description | CNPq: 306331/2016-0 | |
| dc.format | 1-4 | |
| dc.relation | Radiation Physics and Chemistry | |
| dc.rights | openAccess | |
| dc.source | International Symposium on Radiation Physics, 14th, October 07-11, 2018, Cordoba, Argentina | |
| dc.subject | dose rates | |
| dc.subject | radiation doses | |
| dc.subject | low dose irradiation | |
| dc.subject | dosimetry | |
| dc.subject | silicon diodes | |
| dc.subject | thin films | |
| dc.subject | photodiodes | |
| dc.subject | radiation monitoring | |
| dc.title | Current response stability of a commercial PIN photodiode for low dose radiation processing applications | |
| dc.type | Artigo de peri??dico | |
| dc.coverage | I | |
