Detector efficiency calibration for extended gamma-ray sources

dc.contributorVANIN, VITO R.
dc.creatorSANTOS, ROBERTO M. dos
dc.creatorGENEZINI, FREDERICO A.
dc.creatorZAHN, GUILHERME S.
dc.creatorBRAZILIAN WORKSHOP ON NUCLEAR PHYSICS, 33rd
dc.date2014-11-17T18:39:22Z
dc.date2014-11-18T19:00:15Z
dc.date2015-04-02T03:55:29Z
dc.date2014-11-17T18:39:22Z
dc.date2014-11-18T19:00:15Z
dc.date2015-04-02T03:55:29Z
dc.dateSeptember 7-11, 2010
dc.date.accessioned2023-09-28T13:14:58Z
dc.date.available2023-09-28T13:14:58Z
dc.identifierhttp://repositorio.ipen.br/handle/123456789/17881
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/8991940
dc.format220-230
dc.publisherAmerican Institute of Physics
dc.rightsopenAccess
dc.subjectcalibration
dc.subjectcalibration standards
dc.subjectefficiency
dc.subjectgamma detection
dc.subjectge semiconductor detectors
dc.subjectmonte carlo method
dc.titleDetector efficiency calibration for extended gamma-ray sources
dc.typeTexto completo de evento
dc.coverageI


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