Calibration methodology for instruments utilized in X radiation beams diagnostic level

dc.creatorPOTIENS, M.P.A.
dc.creatorCALDAS, L.V.E.
dc.creatorINTERNATIONAL JOINT MEETING/CONGRESO INTERNACIONAL CONJUNTO
dc.date2014-11-17T18:32:28Z
dc.date2014-11-18T18:39:37Z
dc.date2015-04-02T02:36:21Z
dc.date2014-11-17T18:32:28Z
dc.date2014-11-18T18:39:37Z
dc.date2015-04-02T02:36:21Z
dc.dateJul. 11-14, 2004
dc.date.accessioned2023-09-28T13:12:15Z
dc.date.available2023-09-28T13:12:15Z
dc.identifierhttp://repositorio.ipen.br/handle/123456789/17431
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/8991033
dc.rightsopenAccess
dc.subjectamericium 241
dc.subjectcalibration
dc.subjectdiagrams
dc.subjectdosimetry
dc.subjectelectric potential
dc.subjectexperimental data
dc.subjectgamma radiation
dc.subjecthigh-purity ge detectors
dc.subjectionization chambers
dc.subjectiso
dc.subjectkerma
dc.subjectmeasuring instruments
dc.subjectpeaks
dc.subjectradiation protection
dc.subjectradiation quality
dc.subjectradiology
dc.subjectx radiation
dc.titleCalibration methodology for instruments utilized in X radiation beams diagnostic level
dc.typeTexto completo de evento
dc.coverageI


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