Test and evaluation of semiconductor components in mixed field radiation monitoring

dc.creatorCARDENAS, JOSE P.N.
dc.creatorMADI FILHO, TUFIC
dc.creatorRODRIGUES, LETICIA L.C.
dc.creatorINTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st
dc.date2014-11-17T17:05:35Z
dc.date2014-11-18T19:27:16Z
dc.date2015-04-02T00:50:20Z
dc.date2014-11-17T17:05:35Z
dc.date2014-11-18T19:27:16Z
dc.date2015-04-02T00:50:20Z
dc.dateSeptember 27 - October 2, 2009
dc.date.accessioned2023-09-28T13:08:52Z
dc.date.available2023-09-28T13:08:52Z
dc.identifierhttp://repositorio.ipen.br/handle/123456789/12015
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/8989838
dc.publisherSao Paulo: ABEN, 2009
dc.rightsopenAccess
dc.subjectexperimental data
dc.subjectiear-1 reactor
dc.subjectionizing radiations
dc.subjectipen-mb-1 reactor
dc.subjectneutron converters
dc.subjectneutron detection
dc.subjectneutron radiography
dc.subjectneutron sources
dc.subjectperformance
dc.subjectphotodiodes
dc.subjectradiation monitoring
dc.subjectsurface barrier detectors
dc.titleTest and evaluation of semiconductor components in mixed field radiation monitoring
dc.typeTexto completo de evento
dc.coverageI


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