Influence of the dead-zone thickness on a PIN diode response for alfa spectrometry

dc.creatorPASCOALINO, KELLY C.S.
dc.creatorCAMARGO, FABIO de
dc.creatorGONCALVES, JOSEMARY A.C.
dc.creatorBUENO, CARMEN C.
dc.creatorINTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 8th/ MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 15th
dc.date2014-11-17T18:00:26Z
dc.date2014-11-18T18:08:24Z
dc.date2015-04-02T00:19:24Z
dc.date2014-11-17T18:00:26Z
dc.date2014-11-18T18:08:24Z
dc.date2015-04-02T00:19:24Z
dc.dateSept. 30 - Oct. 5, 2007
dc.date.accessioned2023-09-28T13:07:46Z
dc.date.available2023-09-28T13:07:46Z
dc.identifierhttp://repositorio.ipen.br/handle/123456789/15755
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/8989484
dc.publisherSao Paulo: ABEN, 2007
dc.rightsopenAccess
dc.subjectalpha detection
dc.subjectalpha spectroscopy
dc.subjectamericium 241
dc.subjectamericium
dc.subjectcurium 244
dc.subjectcurium
dc.subjectjunction diodes
dc.subjectplutonium 239
dc.subjectplutonium
dc.titleInfluence of the dead-zone thickness on a PIN diode response for alfa spectrometry
dc.typeTexto completo de evento
dc.coverageI


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