Temperature dependence of the electric field gradient at sup(181)Ta in nanostructured HfOsub(2) film

dc.creatorCAVALCANTE, F.H.C.
dc.creatorCARBONARI, A.W.
dc.creatorSOARES, J.C.
dc.creatorNTERNATIONAL CONFERENCE ON DEFECTS IN INSULATING MATERIALS, 16th
dc.date2014-07-15T13:38:24Z
dc.date2014-07-30T11:51:08Z
dc.date2014-07-15T13:38:24Z
dc.date2014-07-30T11:51:08Z
dc.dateAugust 24-29, 2008
dc.date.accessioned2023-09-28T12:35:56Z
dc.date.available2023-09-28T12:35:56Z
dc.identifierhttp://repositorio.ipen.br/handle/123456789/4562
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/8975924
dc.rightsclosedAccess
dc.sourcePublicado em: Journal of Physics: Conference Series, v. 249, n. 1, p. 012051-1 ??? 012051-6, 2010
dc.subjecttemperature dependence
dc.subjectelectric fields
dc.subjecttantalum 181
dc.subjectnanostructures
dc.subjecthafnium oxides
dc.subjectthin films
dc.subjectperturbed angular correlation
dc.titleTemperature dependence of the electric field gradient at sup(181)Ta in nanostructured HfOsub(2) film
dc.typeTexto completo de evento
dc.coverageI


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