dc.creatorMOREIRA, DENISE S.
dc.creatorKOSKINAS, MARINA F.
dc.creatorYAMAZAKI, IONE M.
dc.creatorDIAS, MAURO S.
dc.date2010
dc.date2014-07-15T13:38:50Z
dc.date2014-07-30T11:50:54Z
dc.date2014-07-15T13:38:50Z
dc.date2014-07-30T11:50:54Z
dc.date.accessioned2023-09-28T12:35:50Z
dc.date.available2023-09-28T12:35:50Z
dc.identifier0969-8043
dc.identifierhttp://repositorio.ipen.br/handle/123456789/4597
dc.identifier4-5
dc.identifier68
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/8975867
dc.format596-599
dc.relationApplied Radiation and Isotopes
dc.rightsopenAccess
dc.sourceApresentado tambem em: International Topical Meeting on Industrial Radiation and Radioisotope Measurement Application, 7th, June 22-27, Praga, Republica Theca
dc.subjectchromium 51
dc.subjectamericium 241
dc.subjectx radiation
dc.subjectgamma radiation
dc.subjectdecay
dc.subjectprobability
dc.subjectsemiconductor detectors
dc.titleDetermination of sup(51)Cr and sup(241)Am X-ray and gamma-ray emission probabilities per decay
dc.typeArtigo de peri??dico
dc.coverageI


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