Characterization of nanostructured HfOsub(2) films using RBS and PAC

dc.creatorCAVALCANTE, F.H.M.
dc.creatorGOMES, M.R.
dc.creatorCARBONARI, A.W.
dc.creatorPEREIRA, L.F.D.
dc.creatorROSSETTO, D.A.
dc.creatorCOSTA, M.S.
dc.creatorALVES, E.
dc.creatorBARRADAS, N.P.
dc.creatorFRANCO, N.
dc.creatorREDONDO, L.M.
dc.creatorLOPES, A.M.L.
dc.creatorSOARES, J.C.
dc.date2012
dc.date2014-07-15T13:35:32Z
dc.date2014-07-30T11:49:14Z
dc.date2014-07-15T13:35:32Z
dc.date2014-07-30T11:49:14Z
dc.date.accessioned2023-09-28T12:35:05Z
dc.date.available2023-09-28T12:35:05Z
dc.identifier0168-583X
dc.identifierhttp://repositorio.ipen.br/handle/123456789/4301
dc.identifier273
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/8975441
dc.format195-198
dc.relationNuclear Instruments and Methods in Physics Research, B
dc.rightsopenAccess
dc.subjecthyperfine structure
dc.subjecttantalum
dc.subjectnanostructures
dc.subjecthafnium oxides
dc.subjectthin films
dc.subjectdoped materials
dc.subjectiron
dc.subjectrutherford backscattering spectroscopy
dc.subjectperturbed angular correlation
dc.titleCharacterization of nanostructured HfOsub(2) films using RBS and PAC
dc.typeArtigo de peri??dico
dc.coverageI


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