dc.contributor | Universidade Estadual Paulista (UNESP) | |
dc.creator | Pontes, D. S L | |
dc.creator | Pontes, F. M. | |
dc.creator | Pereira-da-Silva, Marcelo A. | |
dc.creator | Zampieri, M. | |
dc.creator | Chiquito, A. J. | |
dc.creator | Pizani, P. S. | |
dc.creator | Longo, Elson | |
dc.date | 2014-05-27T11:30:42Z | |
dc.date | 2016-10-25T18:54:13Z | |
dc.date | 2014-05-27T11:30:42Z | |
dc.date | 2016-10-25T18:54:13Z | |
dc.date | 2013-09-20 | |
dc.date.accessioned | 2017-04-06T02:39:22Z | |
dc.date.available | 2017-04-06T02:39:22Z | |
dc.identifier | Ceramics International. | |
dc.identifier | 0272-8842 | |
dc.identifier | http://hdl.handle.net/11449/76602 | |
dc.identifier | http://acervodigital.unesp.br/handle/11449/76602 | |
dc.identifier | 10.1016/j.ceramint.2013.08.063 | |
dc.identifier | WOS:000331017500033 | |
dc.identifier | 2-s2.0-84884181540 | |
dc.identifier | http://dx.doi.org/10.1016/j.ceramint.2013.08.063 | |
dc.identifier.uri | http://repositorioslatinoamericanos.uchile.cl/handle/2250/897294 | |
dc.description | Structural, microstructural and ferroelectric properties of Pb0.90Ca0.10TiO3 (PCT10) thin films deposited using La0.50Sr0.50CoO3 (LSCO) thin films which serve only as a buffer layer were compared with properties of the thin films grown using a platinum-coated silicon substrate. LSCO and PCT10 thin films were grown using the chemical solution deposition method and heat-treated in an oxygen atmosphere at 700 °C and 650 °C in a tube oven, respectively. X-ray diffraction (XRD) and Raman spectroscopy results showed that PCT10 thin films deposited directly on a platinum-coated silicon substrate exhibit a strong tetragonal character while thin films with the LSCO buffer layer displayed a smaller tetragonal character. Surface morphology observations by atomic force microscopy (AFM) revealed that PCT10 thin films with a LSCO buffer layer had a smoother surface and smaller grain size compared with thin films grown on a platinum-coated silicon substrate. Additionally, the capacitance versus voltage curves and hysteresis loop measurement indicated that the degree of polarization decreased for PCT10 thin films on a LSCO buffer layer compared with PCT10 thin films deposited directly on a platinum-coated silicon substrate. This phenomenon can be described as the smaller shift off-center of Ti atoms along the c-direction 〈001〉 inside the TiO6 octahedron unit due to the reduction of lattice parameters. Remnant polarization (P r ) values are about 30 μC/cm2 and 12 μC/cm2 for PCT10/Pt and PCT10/LSCO thin films, respectively. Results showed that the LSCO buffer layer strongly influenced the structural, microstructural and ferroelectric properties of PCT10 thin films. © 2013 Elsevier Ltd and Techna Group S.r.l. | |
dc.language | eng | |
dc.relation | Ceramics International | |
dc.rights | info:eu-repo/semantics/closedAccess | |
dc.subject | Buffer layers | |
dc.subject | Chemical synthesis | |
dc.subject | Pb1-x Ca x TiO3 | |
dc.subject | Thin films | |
dc.title | Ferroelectric and structural instability of (Pb,Ca)TiO3 thin films prepared in an oxygen atmosphere and deposited on LSCO thin films which act as a buffer layer | |
dc.type | Otro | |