Ferroelectric and structural instability of (Pb,Ca)TiO3 thin films prepared in an oxygen atmosphere and deposited on LSCO thin films which act as a buffer layer

dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorPontes, D. S L
dc.creatorPontes, F. M.
dc.creatorPereira-da-Silva, Marcelo A.
dc.creatorZampieri, M.
dc.creatorChiquito, A. J.
dc.creatorPizani, P. S.
dc.creatorLongo, Elson
dc.date2014-05-27T11:30:42Z
dc.date2016-10-25T18:54:13Z
dc.date2014-05-27T11:30:42Z
dc.date2016-10-25T18:54:13Z
dc.date2013-09-20
dc.date.accessioned2017-04-06T02:39:22Z
dc.date.available2017-04-06T02:39:22Z
dc.identifierCeramics International.
dc.identifier0272-8842
dc.identifierhttp://hdl.handle.net/11449/76602
dc.identifierhttp://acervodigital.unesp.br/handle/11449/76602
dc.identifier10.1016/j.ceramint.2013.08.063
dc.identifierWOS:000331017500033
dc.identifier2-s2.0-84884181540
dc.identifierhttp://dx.doi.org/10.1016/j.ceramint.2013.08.063
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/897294
dc.descriptionStructural, microstructural and ferroelectric properties of Pb0.90Ca0.10TiO3 (PCT10) thin films deposited using La0.50Sr0.50CoO3 (LSCO) thin films which serve only as a buffer layer were compared with properties of the thin films grown using a platinum-coated silicon substrate. LSCO and PCT10 thin films were grown using the chemical solution deposition method and heat-treated in an oxygen atmosphere at 700 °C and 650 °C in a tube oven, respectively. X-ray diffraction (XRD) and Raman spectroscopy results showed that PCT10 thin films deposited directly on a platinum-coated silicon substrate exhibit a strong tetragonal character while thin films with the LSCO buffer layer displayed a smaller tetragonal character. Surface morphology observations by atomic force microscopy (AFM) revealed that PCT10 thin films with a LSCO buffer layer had a smoother surface and smaller grain size compared with thin films grown on a platinum-coated silicon substrate. Additionally, the capacitance versus voltage curves and hysteresis loop measurement indicated that the degree of polarization decreased for PCT10 thin films on a LSCO buffer layer compared with PCT10 thin films deposited directly on a platinum-coated silicon substrate. This phenomenon can be described as the smaller shift off-center of Ti atoms along the c-direction 〈001〉 inside the TiO6 octahedron unit due to the reduction of lattice parameters. Remnant polarization (P r ) values are about 30 μC/cm2 and 12 μC/cm2 for PCT10/Pt and PCT10/LSCO thin films, respectively. Results showed that the LSCO buffer layer strongly influenced the structural, microstructural and ferroelectric properties of PCT10 thin films. © 2013 Elsevier Ltd and Techna Group S.r.l.
dc.languageeng
dc.relationCeramics International
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectBuffer layers
dc.subjectChemical synthesis
dc.subjectPb1-x Ca x TiO3
dc.subjectThin films
dc.titleFerroelectric and structural instability of (Pb,Ca)TiO3 thin films prepared in an oxygen atmosphere and deposited on LSCO thin films which act as a buffer layer
dc.typeOtro


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