dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorHein, L. R O
dc.creatorCampos, K. A.
dc.creatorCaltabiano, P. C R O
dc.creatorKostov, K. G.
dc.date2014-05-27T11:29:01Z
dc.date2016-10-25T18:47:52Z
dc.date2014-05-27T11:29:01Z
dc.date2016-10-25T18:47:52Z
dc.date2013-05-01
dc.date.accessioned2017-04-06T02:21:50Z
dc.date.available2017-04-06T02:21:50Z
dc.identifierScanning, v. 35, n. 3, p. 196-204, 2013.
dc.identifier0161-0457
dc.identifier1932-8745
dc.identifierhttp://hdl.handle.net/11449/75197
dc.identifierhttp://acervodigital.unesp.br/handle/11449/75197
dc.identifier10.1002/sca.21048
dc.identifierWOS:000320102300005
dc.identifier2-s2.0-84878748763
dc.identifierhttp://dx.doi.org/10.1002/sca.21048
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/895944
dc.descriptionThe methodology for fracture analysis of polymeric composites with scanning electron microscopes (SEM) is still under discussion. Many authors prefer to use sputter coating with a conductive material instead of applying low-voltage (LV) or variable-pressure (VP) methods, which preserves the original surfaces. The present work examines the effects of sputter coating with 25 nm of gold on the topography of carbon-epoxy composites fracture surfaces, using an atomic force microscope. Also, the influence of SEM imaging parameters on fractal measurements is evaluated for the VP-SEM and LV-SEM methods. It was observed that topographic measurements were not significantly affected by the gold coating at tested scale. Moreover, changes on SEM setup leads to nonlinear outcome on texture parameters, such as fractal dimension and entropy values. For VP-SEM or LV-SEM, fractal dimension and entropy values did not present any evident relation with image quality parameters, but the resolution must be optimized with imaging setup, accompanied by charge neutralization. © Wiley Periodicals, Inc.
dc.languageeng
dc.relationScanning
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectatomic force microscopy
dc.subjectfractal dimension
dc.subjectimage quality
dc.subjectquantitative fractography
dc.subjectscanning electron microscopy
dc.subjectAtomic force microscope (AFM)
dc.subjectCarbon-epoxy composite
dc.subjectCharge neutralization
dc.subjectFractal measurement
dc.subjectImage quality parameters
dc.subjectPolymeric composites
dc.subjectQuantitative fractography
dc.subjectTopographic measurements
dc.subjectAtomic force microscopy
dc.subjectCoatings
dc.subjectConductive materials
dc.subjectEntropy
dc.subjectFractal dimension
dc.subjectFractography
dc.subjectFracture mechanics
dc.subjectGold
dc.subjectGold coatings
dc.subjectImage quality
dc.subjectScanning electron microscopy
dc.subjectcarbon
dc.subjectepoxy resin
dc.subjectgold
dc.subjectpolymer
dc.subjectelectric potential
dc.subjectentropy
dc.subjectfractal analysis
dc.subjectmaterial coating
dc.subjectpriority journal
dc.subjectquantitative analysis
dc.subjectscanning electron microscope
dc.subjectsurface property
dc.titleA brief discussion about image quality and SEM methods for quantitative fractography of polymer composites
dc.typeOtro


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