dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorBasho, É N.
dc.creatorSakai, R. T.
dc.creatorDa Cruz, F. M D L
dc.creatorDe Melo, H. G.
dc.creatorBenedetti, Assis Vicente
dc.creatorSuegama, P. H.
dc.date2014-05-27T11:27:19Z
dc.date2016-10-25T18:40:08Z
dc.date2014-05-27T11:27:19Z
dc.date2016-10-25T18:40:08Z
dc.date2012-12-01
dc.date.accessioned2017-04-06T02:04:23Z
dc.date.available2017-04-06T02:04:23Z
dc.identifierECS Transactions, v. 43, n. 1, p. 3-7, 2012.
dc.identifier1938-5862
dc.identifier1938-6737
dc.identifierhttp://hdl.handle.net/11449/73842
dc.identifierhttp://acervodigital.unesp.br/handle/11449/73842
dc.identifier10.1149/1.4704931
dc.identifier2-s2.0-84879436516
dc.identifierhttp://dx.doi.org/10.1149/1.4704931
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/894625
dc.descriptionThis work studied the influence of the rare earth (Ce3+ and Ce4+) elements concentration in polysiloxane flints deposited on copper by dip-coating process, and evaluated their resistance in a 3.5 wt.% NaCl medium. Classical electrochemistry techniques were used as open circuit potential, polarization curves and electrochemical impedance spectroscopy. The results revealed that by adding low concentration of Ce4+ ions, the coating prevents the electrolyte uptake any longer retarding the substrate degradation consequently. ©The Electrochemical Society.
dc.languageeng
dc.relationECS Transactions
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectCopper surface
dc.subjectDip-coating process
dc.subjectLow concentrations
dc.subjectOpen circuit potential
dc.subjectPolarization curves
dc.subjectSubstrate degradation
dc.subjectCopper
dc.subjectDegradation
dc.subjectElectrochemical impedance spectroscopy
dc.subjectElectrochemistry
dc.subjectSilicon compounds
dc.subjectSilicones
dc.subjectCoatings
dc.titleStudy of the influence of the rare earth elements (Ce3+ and Ce4+) concentration on the siloxanes coating applied on the copper surface
dc.typeOtro


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