dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorAraújo, E. B.
dc.creatorEiras, J. A.
dc.date2014-05-27T11:20:23Z
dc.date2016-10-25T18:17:31Z
dc.date2014-05-27T11:20:23Z
dc.date2016-10-25T18:17:31Z
dc.date2002-01-01
dc.date.accessioned2017-04-06T01:01:29Z
dc.date.available2017-04-06T01:01:29Z
dc.identifierFerroelectrics, v. 270, p. 51-56.
dc.identifier0015-0193
dc.identifier1563-5112
dc.identifierhttp://hdl.handle.net/11449/66760
dc.identifierhttp://acervodigital.unesp.br/handle/11449/66760
dc.identifier10.1080/00150190211254
dc.identifierWOS:000176862200010
dc.identifier2-s2.0-33746290172
dc.identifierhttp://dx.doi.org/10.1080/713716104
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/888283
dc.descriptionRecently, was proposed a chemical method for preparation of ferroelectric thin films based on oxide precursors. In this work, PZT thin films were prepared to attest the viability of this method for cation-substitution. In this study, a small concentration of Nb (5 mol%) was selected as substitute of B-site in ABO 3 structure of PZT. Dielectric and ferroelectric properties of PZT films were studied as a function of cation-substitution. Results for Nb-PZT were compared with PZT films undoped. The values of dielectric constant, at typical 100 kHz frequency, were 358 and 137, for PZT and Nb-PZT films respectively. Remanent polarizations of these films were respectively 7.33 μ C/cm 2 and 13.3 μ C/cm 2 , while the measured coercive fields were 101 kV/cm and 93 kV/cm. As a result, changes on observed dielectric and ferroelectric values confirm the Nb substitution in PZT thin film produced by oxide precursor method. © 2002 Taylor & Francis.
dc.languageeng
dc.relationFerroelectrics
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectFerroelectric
dc.subjectPZT
dc.subjectThin films
dc.subjectDielectric properties
dc.subjectFerroelectricity
dc.subjectLead compounds
dc.subjectPermittivity
dc.subjectPolarization
dc.subjectSubstitution reactions
dc.subjectCation-substitution
dc.subjectOxide precursor method
dc.subjectRemanent polarizations
dc.titleStructural, dielectric and ferroelectric properties of Nb-doped PZT thin films produced by oxide precursor method
dc.typeOtro


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