dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorRibeiro, Willian C.
dc.creatorAraujo, Rafael G. C.
dc.creatorBueno, Paulo Roberto
dc.date2014-05-20T15:33:54Z
dc.date2016-10-25T18:10:33Z
dc.date2014-05-20T15:33:54Z
dc.date2016-10-25T18:10:33Z
dc.date2011-03-28
dc.date.accessioned2017-04-06T00:35:05Z
dc.date.available2017-04-06T00:35:05Z
dc.identifierApplied Physics Letters. Melville: Amer Inst Physics, v. 98, n. 13, p. 3, 2011.
dc.identifier0003-6951
dc.identifierhttp://hdl.handle.net/11449/42350
dc.identifierhttp://acervodigital.unesp.br/handle/11449/42350
dc.identifier10.1063/1.3574016
dc.identifierWOS:000289153600058
dc.identifierWOS000289153600058.pdf
dc.identifierhttp://dx.doi.org/10.1063/1.3574016
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/885002
dc.descriptionIn this work it was demonstrated that the addition of Sn on CaCu3Ti4O12 material improved non-Ohmic behavior by suppressing dielectric properties. It was noted that the improvement of the varistor characteristics, monitored by the increase in nonlinear coefficient, occurs with the disappearance of the grain dielectric relaxation process with concomitant decreasing of both dielectric constant and dielectric loss values. By forming a solid solution, Sn4+ was incorporated into CaCu3Ti4O12 matrix deforming the crystal lattice and restricting the formation of polaronic stacking faults. Thus, the dielectric relaxation due to polaronic defects is believed to be the origin of the huge dielectric properties disappearance. This framework is in agreement with the nanosized barrier layer capacitor model. (C) 2011 American Institute of Physics. [doi:10.1063/1.3574016]
dc.descriptionConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.descriptionFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.languageeng
dc.publisherAmerican Institute of Physics (AIP)
dc.relationApplied Physics Letters
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.titleThe dielectric suppress and the control of semiconductor non-Ohmic feature of CaCu3Ti4O12 by means of tin doping
dc.typeOtro


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