Fault current test of a bifilar Bi-2212 bulk coil

dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorBaldan, Carlos Alberto
dc.creatorShigue, Carlos Y.
dc.creatorRuppert Filho, Ernesto
dc.date2014-05-20T15:32:50Z
dc.date2016-10-25T18:09:12Z
dc.date2014-05-20T15:32:50Z
dc.date2016-10-25T18:09:12Z
dc.date2008-06-01
dc.date.accessioned2017-04-06T00:29:50Z
dc.date.available2017-04-06T00:29:50Z
dc.identifierIEEE Transactions on Applied Superconductivity. Piscataway: IEEE-Inst Electrical Electronics Engineers Inc, v. 18, n. 2, p. 664-667, 2008.
dc.identifier1051-8223
dc.identifierhttp://hdl.handle.net/11449/41632
dc.identifierhttp://acervodigital.unesp.br/handle/11449/41632
dc.identifier10.1109/TASC.2008.920595
dc.identifierWOS:000256625700139
dc.identifierhttp://dx.doi.org/10.1109/TASC.2008.920595
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/884319
dc.descriptionA bifilar Bi-2212 bulk coil with parallel shunt resistor was tested under fault current condition using a 3 MVA single-phase transformer in a 220 V-60 Hz line achieving fault current peak of 8 kA. The fault current tests are performed from steady state peak current of 200 A by applying controlled short circuits up to 8 kA varying the time period from one to six cycles. The test results show the function of the shunt resistor providing homogeneous quench behavior of the HTS coil besides its intrinsic stabilizing role. The limiting current ratio achieves a factor 4.2 during 5 cycles without any degradation.
dc.languageeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relationIEEE Transactions on Applied Superconductivity
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectBi-2212 bulk coil
dc.subjectHTS bifilar coil
dc.subjectHTS coils
dc.subjectsuperconducting fault current limiter
dc.titleFault current test of a bifilar Bi-2212 bulk coil
dc.typeOtro


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