Effects of post-annealing on the dielectric properties of Au/BaTiO3/Pt thin film capacitors

dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorLee, EJH
dc.creatorPontes, F. M.
dc.creatorLeite, E. R.
dc.creatorLongo, Elson
dc.creatorMagnani, R.
dc.creatorPizani, P. S.
dc.creatorVarela, José Arana
dc.date2014-05-20T15:28:28Z
dc.date2016-10-25T18:03:31Z
dc.date2014-05-20T15:28:28Z
dc.date2016-10-25T18:03:31Z
dc.date2004-04-01
dc.date.accessioned2017-04-06T00:07:20Z
dc.date.available2017-04-06T00:07:20Z
dc.identifierMaterials Letters. Amsterdam: Elsevier B.V., v. 58, n. 11, p. 1715-1721, 2004.
dc.identifier0167-577X
dc.identifierhttp://hdl.handle.net/11449/38267
dc.identifierhttp://acervodigital.unesp.br/handle/11449/38267
dc.identifier10.1016/j.matlet.2003.10.047
dc.identifierWOS:000220244900011
dc.identifierhttp://dx.doi.org/10.1016/j.matlet.2003.10.047
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/881415
dc.descriptionBarium titanate thin films were prepared by the polymeric precursor method and deposited onto Pt/Ti/SiO2/Si substrates. X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM), Fourier transform infrared spectroscopy (FT-IR) and micro-Raman spectroscopy were used to investigate the formation of the BaTiO3 perovskite phase. Afterwards, the films were submitted to post-annealing treatments in oxygen and nitrogen atmospheres at 300 degreesC for 2 h, and had their dielectric properties measured. It was observed that the electric properties of the thin films are very sensitive to the nature of the post-annealing atmosphere. This study demonstrates that post-annealing in an oxygen atmosphere increases the dielectric relaxation phenomenon and that post-annealing in a nitrogen atmosphere produces a slight dielectric relaxation. (C) 2004 Elsevier B.V All rights reserved.
dc.languageeng
dc.publisherElsevier B.V.
dc.relationMaterials Letters
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectbarium titanate
dc.subjectdielectric properties
dc.subjectconduction mechanism
dc.subjectpost-annealing
dc.titleEffects of post-annealing on the dielectric properties of Au/BaTiO3/Pt thin film capacitors
dc.typeOtro


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