Attribute charts for monitoring the mean vector of bivariate processes

dc.contributorUniversidade de São Paulo (USP)
dc.contributorUniversidade Estadual Paulista (Unesp)
dc.creatorHo, Linda Lee
dc.creatorCosta, Antonio [UNESP]
dc.date2015-10-22T07:08:45Z
dc.date2015-10-22T07:08:45Z
dc.date2015-06-01
dc.date.accessioned2023-09-12T07:03:05Z
dc.date.available2023-09-12T07:03:05Z
dc.identifierhttp://onlinelibrary.wiley.com/doi/10.1002/qre.1628/abstract
dc.identifierQuality And Reliability Engineering International. Hoboken: Wiley-blackwell, v. 31, n. 4, p. 683-693, 2015.
dc.identifier0748-8017
dc.identifierhttp://hdl.handle.net/11449/129790
dc.identifier10.1002/qre.1628
dc.identifierWOS:000354883900013
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/8779119
dc.descriptionThis article proposes two Shewhart charts, denoted np(xy) and np(w) charts, which use attribute inspection to control the mean vector ((x); (y)) of bivariate processes. The units of the sample are classified as first-class, second-class, or third-class units, according to discriminate limits and the values of their two quality characteristics, X and Y. When the np(xy) chart is in use, the monitoring statistic is M=N-1+N-2, where N-1 and N-2 are the number of sample units with a second-class and third-class classification, respectively. When the np(w) chart is in use, the monitoring statistic is W=N-1+2N(2). We assume that the quality characteristics X and Y follow a bivariate normal distribution and that the assignable cause shifts the mean vector without changing the covariance matrix. In general, the synthetic np(xy) and np(w) charts require twice larger samples to outperform the T-2 chart. Copyright (c) 2014 John Wiley &Sons, Ltd.
dc.descriptionConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.descriptionUniv Sao Paulo, Dept Prod Engn, BR-05508900 Sao Paulo, Brazil
dc.descriptionUniv Estadual Paulista, Dept Prod Engn, Sao Paulo, Brazil
dc.descriptionUniv Estadual Paulista, Dept Prod Engn, Sao Paulo, Brazil
dc.format683-693
dc.languageeng
dc.publisherWiley-Blackwell
dc.relationQuality And Reliability Engineering International
dc.relation1.604
dc.relation0,955
dc.rightsAcesso restrito
dc.sourceWeb of Science
dc.subjectDiscriminating limits
dc.subjectNp(xy) chart
dc.subjectNp(w) chart
dc.subjectBivariate normal processes
dc.subjectAttribute and variable control charts
dc.subjectSynthetic chart
dc.subjectT-2 chart
dc.titleAttribute charts for monitoring the mean vector of bivariate processes
dc.typeArtigo


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