dc.contributor | Universidade Estadual Paulista (UNESP) | |
dc.creator | Balzar, D. | |
dc.creator | Ramakrishnan, P. A. | |
dc.creator | Spagnol, P. | |
dc.creator | Mani, S. | |
dc.creator | Hermann, A. M. | |
dc.creator | Matin, M. A. | |
dc.date | 2014-05-20T15:20:36Z | |
dc.date | 2016-10-25T17:53:46Z | |
dc.date | 2014-05-20T15:20:36Z | |
dc.date | 2016-10-25T17:53:46Z | |
dc.date | 2002-11-01 | |
dc.date.accessioned | 2017-04-05T23:26:49Z | |
dc.date.available | 2017-04-05T23:26:49Z | |
dc.identifier | Japanese Journal of Applied Physics Part 1-regular Papers Brief Communications & Review Papers. Tokyo: Japan Soc Applied Physics, v. 41, n. 11B, p. 6628-6632, 2002. | |
dc.identifier | 0021-4922 | |
dc.identifier | http://hdl.handle.net/11449/31874 | |
dc.identifier | http://acervodigital.unesp.br/handle/11449/31874 | |
dc.identifier | 10.1143/JJAP.41.6628 | |
dc.identifier | WOS:000182730300004 | |
dc.identifier | http://dx.doi.org/10.1143/JJAP.41.6628 | |
dc.identifier.uri | http://repositorioslatinoamericanos.uchile.cl/handle/2250/876333 | |
dc.description | Pristine, W and Mn 1% doped Ba(0.6)Sr(0.4)TiO(3) epitaxial thin films grown on the LaAlO(3) substrate were deposited by pulsed laser deposition (PLD). Dielectric and ferroelectric properties were determined by the capacitance measurements and X-ray diffraction was used to determine both residual elastic strains and defect-related inhomogeneous strains-by analyzing diffraction line shifts and line broadening, respectively. We found that both elastic and inhomogeneous strains are affected by doping. This strain correlates with the change in Curie-Weiss temperature and can qualitatively explain changes in dielectric loss. To explain the experimental findings, we model the dielectric and ferroelectric properties of interest in the framework of the Landau-Ginzburg-Devonshire thermodynamic theory. As expected, an, elastic-strain contribution due to the epilayer-substrate misfit has an important influence on the free-energy. However, additional terms that correspond to the defect-related inhomogeneous strain had to be introduced to fully explain the measurements. | |
dc.language | eng | |
dc.publisher | Japan Soc Applied Physics | |
dc.relation | Japanese Journal of Applied Physics Part 1-regular Papers Brief Communications & Review Papers | |
dc.rights | info:eu-repo/semantics/closedAccess | |
dc.subject | ferroelectric thin films | |
dc.subject | strain | |
dc.subject | defects | |
dc.subject | Curie-Weiss temperature | |
dc.subject | barium-strontium titanate | |
dc.title | Influence of strains and defects on ferroelectric and dielectric properties of thin-film barium-strontium titanates | |
dc.type | Otro | |