dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorCosta, AFB
dc.date2014-05-20T15:20:16Z
dc.date2016-10-25T17:53:20Z
dc.date2014-05-20T15:20:16Z
dc.date2016-10-25T17:53:20Z
dc.date1999-10-01
dc.date.accessioned2017-04-05T23:24:51Z
dc.date.available2017-04-05T23:24:51Z
dc.identifierJournal of Quality Technology. Milwaukee: Amer Soc Quality Control-asqc, v. 31, n. 4, p. 387-397, 1999.
dc.identifier0022-4065
dc.identifierhttp://hdl.handle.net/11449/31595
dc.identifierhttp://acervodigital.unesp.br/handle/11449/31595
dc.identifierWOS:000083162800003
dc.identifierhttp://asq.org/qic/display-item/?item=13851
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/876105
dc.descriptionRecent studies have shown that the (X) over bar chart with variable sampling intervals (VSI) and/or with variable sample sizes (VSS) detects process shifts faster than the traditional (X) over bar chart. This article extends these studies for processes that are monitored by both the (X) over bar and R charts. A Markov chain model is used to determine the properties of the joint (X) over bar and R charts with variable sample sizes and sampling intervals (VSSI). The VSSI scheme improves the joint (X) over bar and R control chart performance in terms of the speed with which shifts in the process mean and/or variance are detected.
dc.languageeng
dc.publisherAmer Soc Quality Control-asqc
dc.relationJournal of Quality Technology
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.titleJoint (X)over-bar and R charts with variable sample sizes and sampling intervals
dc.typeOtro


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