A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip

dc.creatorCota, Erika Fernandes
dc.creatorKastensmidt, Fernanda Gusmão de Lima
dc.creatorSantos, Maico Cassel dos
dc.creatorHervé, Marcos Barcellos
dc.creatorAlmeida, Pedro Rogério Vieira de
dc.creatorMeirelles, Paulo Roberto Miranda
dc.creatorAmory, Alexandre de Morais
dc.creatorLubaszewski, Marcelo Soares
dc.date2011-01-29T06:00:40Z
dc.date2008
dc.identifier0018-9340
dc.identifierhttp://hdl.handle.net/10183/27611
dc.identifier000666993
dc.descriptionA novel strategy for detecting interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control, and communication handshake wires are considered in a cost-effective test sequence for mesh NoC topologies based on XY routing.
dc.formatapplication/pdf
dc.languageeng
dc.relationIEEE transactions on computers. New York. Vol. 57, no 9 (Sept. 2008), p. 1202-1215
dc.rightsOpen Access
dc.subjectFault coverage
dc.subjectInterconnect testing
dc.subjectTest generation
dc.subjectReliability
dc.subjectMicroeletrônica
dc.titleA high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip
dc.typeArtigo de periódico
dc.typeEstrangeiro


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