CHARACTERIZATION OF A SUB-MM WAVE FREQUENCY SELECTIVE SURFACE ON A PERIODICALLY PERFORATED SILICON SUBSTRATE

dc.creatorANGEL ENRIQUE SANCHEZ COLIN
dc.date2012
dc.date.accessioned2023-07-25T16:24:35Z
dc.date.available2023-07-25T16:24:35Z
dc.identifierhttp://inaoe.repositorioinstitucional.mx/jspui/handle/1009/1921
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7807112
dc.descriptionWe carried out measurements of optical transmission through a Frequency Selective Surface (FSS) on a silicon substrate perforated periodically with square cavities of 1 mm². The substrate is covered on one side with a thin film (1 μm thick) of silicon-nitride, thus forming a membrane for each cavity. The measurements were taken using a Martin-Puplett Interferometer over a spectral range from 100 to 650 GHz, providing a maximum transmission value of around 40% at 480 GHz. Analytical and computed results are also presented for comparison purposes.
dc.formatapplication/pdf
dc.languageeng
dc.publisherProgress In Electromagnetics Research M.
dc.relationcitation:Colin, Angel., et al., (2012), Characterization of a sub-mm wave frequency selective surface on a periodically perforated silicon substrate, Progress In Electromagnetics Research M, Vol. 27: 75-81.
dc.rightsinfo:eu-repo/semantics/openAccess
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/4.0
dc.subjectinfo:eu-repo/classification/Inspec/Optical transmission
dc.subjectinfo:eu-repo/classification/Inspec/Frequency selective surface
dc.subjectinfo:eu-repo/classification/cti/1
dc.subjectinfo:eu-repo/classification/cti/21
dc.subjectinfo:eu-repo/classification/cti/21
dc.titleCHARACTERIZATION OF A SUB-MM WAVE FREQUENCY SELECTIVE SURFACE ON A PERIODICALLY PERFORATED SILICON SUBSTRATE
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/acceptedVersion
dc.audiencestudents
dc.audienceresearchers
dc.audiencegeneralPublic


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