dc.creatorANA LUZ MUÑOZ ZURITA
dc.creatorALEXANDER SHCHERBAKOV
dc.date2008
dc.date.accessioned2023-07-25T16:23:05Z
dc.date.available2023-07-25T16:23:05Z
dc.identifierhttp://inaoe.repositorioinstitucional.mx/jspui/handle/1009/1151
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7806349
dc.descriptionPhotodiode’s reflectance plays an important role regarding the relation between responsivity and the incident flux. In this work we analyze how the spectral reflectance changes among photodiodes from the same manufacturer and batch and how the reflectance of three standard photodiodes has drifted during six years. The results show that the reflectance changes from diode to diode within the same batch and also show that the reflectance of photodiodes changes on time. This ageing is spectrally dependent.
dc.formatapplication/pdf
dc.languageeng
dc.publisherOptoelectronics Letters
dc.relationcitation:Muñoz Zurita, A. L., et al., (2008). Differences of silicon photodiode spectral reflectance among the same batch, Optoelectronics Letters. Vol.4(5):347-350
dc.rightsinfo:eu-repo/semantics/openAccess
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/4.0
dc.subjectinfo:eu-repo/classification/cti/1
dc.subjectinfo:eu-repo/classification/cti/22
dc.subjectinfo:eu-repo/classification/cti/2209
dc.subjectinfo:eu-repo/classification/cti/220919
dc.subjectinfo:eu-repo/classification/cti/220919
dc.titleDifferences of silicon photodiode spectral reflectance among the same batch
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/acceptedVersion
dc.audiencestudents
dc.audienceresearchers
dc.audiencegeneralPublic


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