| dc.contributor | REYDEZEL TORRES TORRES | |
| dc.creator | SVETLANA CARSOF SEJAS GARCIA | |
| dc.date | 2014-06 | |
| dc.date.accessioned | 2023-07-25T16:21:00Z | |
| dc.date.available | 2023-07-25T16:21:00Z | |
| dc.identifier | http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/156 | |
| dc.identifier.uri | https://repositorioslatinoamericanos.uchile.cl/handle/2250/7805378 | |
| dc.description | This thesis is dedicated to characterizing, modeling, and analyzing passive components and
interconnects to help solving signal integrity problems occurring in advanced microwave
circuits and systems. This type of systems require ultra-wide bandwidth, low dispersion, and
low attenuation in the signal transmission to allow high-speed data processing and
transmission. In an actual system, however, the transmission of signals from source to destiny
suffers attenuation, dispersion and distortion, in addition to high-order effects like resonances,
crosstalk, reflection, mismatch, etc., which reduce the bandwidth and the quality of the signals.
In this regard, much of the signal power is lost in interconnects, passive devices, and the
corresponding interaction with the propagation media as well as with other devices. For this
reason, it is very important to understand and properly modeling this type of components in an
electronic circuit.
The passive elements characterized in this thesis are found at different integration levels.
Moreover, different functions are performed by these devices depending on the level at which
they are fabricated: interconnection between elements, implementation of matching networks,
filters, oscillators, etc. Thus, in order to provide valuable information for circuit designers, the
characterization process used in this project was based on the processing of S-parameters
measurements, which includes effects corresponding to the intrinsic nature of the passive
device, plus the interaction with the surrounding materials. This information allows to represent
the performance of passive devices and interconnects by using simple circuits that physically
represent their behavior. Bear in mind that using the S-parameters for characterization purposes
requires to take into consideration the parasitic effects of the text fixtures necessary to reach the
devices under test. In this regard, the impact of these fixtures was also studied in detail in this
work.
In addition, the potential of S-parameter measurements for characterizing and modeling the
properties of the materials used in microwave devices is also explored. This points out the fact
that these data is of great value when developing and optimizing circuit and devices since it is
possible to analyze the properties even at the level of the fabrication materials. | |
| dc.format | application/pdf | |
| dc.language | eng | |
| dc.publisher | Instituto Nacional de Astrofísica, Óptica y Electrónica | |
| dc.relation | citation:Sejas-Garcia S.C. | |
| dc.rights | info:eu-repo/semantics/openAccess | |
| dc.rights | http://creativecommons.org/licenses/by-nc-nd/4.0 | |
| dc.subject | info:eu-repo/classification/Microondas/Microwave ovens | |
| dc.subject | info:eu-repo/classification/Circuitos pasivos/Passive circuits | |
| dc.subject | info:eu-repo/classification/Identificación de parámetros/Parameter identification | |
| dc.subject | info:eu-repo/classification/Líneas de transmisión/Transmission lines | |
| dc.subject | info:eu-repo/classification/cti/1 | |
| dc.subject | info:eu-repo/classification/cti/22 | |
| dc.subject | info:eu-repo/classification/cti/2203 | |
| dc.subject | info:eu-repo/classification/cti/2203 | |
| dc.title | Characterization and modeling of passive components and interconnects using microwave techniques | |
| dc.type | info:eu-repo/semantics/doctoralThesis | |
| dc.type | info:eu-repo/semantics/acceptedVersion | |
| dc.audience | students | |
| dc.audience | researchers | |
| dc.audience | generalPublic | |
