dc.creatorJorge Alberto Luna López
dc.creatorAlfredo Morales Sánchez
dc.creatorMARIANO ACEVES MIJARES
dc.creatorJESUS CARRILLO LOPEZ
dc.date2009-09
dc.date.accessioned2023-07-21T15:32:30Z
dc.date.available2023-07-21T15:32:30Z
dc.identifierhttp://cimav.repositorioinstitucional.mx/jspui/handle/1004/2583
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7728529
dc.descriptionSilicon rich oxide (SRO) is a dielectric material that contains silicon nanoparticles (Si-nps). The composition, structure, and emission of the SRO films deposited by low pressure chemical vapor deposition (LPCVD) were studied; Different microscopic and spectroscopic techniques, such as Atomic Force Microscopy (AFM), High Resolution Transmission Electronic Microscopy and Energy Filtered-TEM (HRTEM and EFTEM), Rutherford Backscattering Spectroscopy (RBS), X-Ray Photoelectrons Spectroscopy (XPS) and Photoluminescence (PL) were used to characterize the SRO films. Results show that SRO films are formed by SiO2, Si-nps, and compounds. The composition, structure (morphology and Si-nps) and luminescence of the SRO films varied with the silicon excess.
dc.formatapplication/pdf
dc.languageeng
dc.rightsinfo:eu-repo/semantics/openAccess
dc.rightshttp://creativecommons.org/licenses/by-nc/4.0
dc.subjectinfo:eu-repo/classification/cti/1
dc.subjectinfo:eu-repo/classification/cti/22
dc.subjectinfo:eu-repo/classification/cti/2210
dc.subjectinfo:eu-repo/classification/cti/221020
dc.subjectinfo:eu-repo/classification/cti/221020
dc.titleMICROSCOPY, SPECTROSCOPY AND PHOTOLUMINESCENCE OF OXIDE FILMS WITH SILICON NANOPARTICLES
dc.typeinfo:eu-repo/semantics/conferenceProceedings
dc.typeinfo:eu-repo/semantics/acceptedVersion


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