dc.contributorHILDA ESPERANZA ESPARZA PONCE
dc.contributorJOSE ALBERTO DUARTE MOLLER
dc.creatorIGNACIO YOCUPICIO VILLEGAS
dc.date2009
dc.date.accessioned2023-07-21T15:29:55Z
dc.date.available2023-07-21T15:29:55Z
dc.identifierhttp://cimav.repositorioinstitucional.mx/jspui/handle/1004/972
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7726963
dc.descriptionA series of thin films were grown at 500 ◦C with a Co and Ti base on silico substrate oriented at (4 0 0) by means of the DC co-sputtering technique. For 7 and 11% Co concentrations, 50, 80, and 110W were used. CoTi2 structure was simulated with the FEFF routine of the WinXAS program. XAS analyses were also performed in order to compare simulated results with experimental results. The X-ray diffraction and atomic absorption results reveal a CoTi2 (Fd-3ms) and Ti (P63/mmc) phase, while extended X-ray absorption fine structure spectroscopy shows slight variations in the coordination numbers and distances from close neighbors and have 0–7% deviations. The results showed good agreement between the theoretical and experimental results.
dc.formatapplication/pdf
dc.languageeng
dc.rightsinfo:eu-repo/semantics/openAccess
dc.rightshttp://creativecommons.org/about/cc0/
dc.subjectinfo:eu-repo/classification/CoTi2/X-Ray
dc.subjectinfo:eu-repo/classification/cti/1
dc.subjectinfo:eu-repo/classification/cti/22
dc.subjectinfo:eu-repo/classification/cti/2299
dc.subjectinfo:eu-repo/classification/cti/229999
dc.subjectinfo:eu-repo/classification/cti/229999
dc.titleX-ray absorption spectroscopy and X-ray diffraction analysis of crystalline CoTi2 grown by DC co-sputtering: A theoretical and experimental comparison
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/submittedVersion


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