dc.creatorJorge Mauricio Flores Moreno
dc.creatorMOISES CYWIAK GARBARCEWICZ
dc.creatorFERNANDO MENDOZA SANTOYO
dc.date2009-12-23
dc.date.accessioned2023-07-21T15:15:48Z
dc.date.available2023-07-21T15:15:48Z
dc.identifierhttp://cio.repositorioinstitucional.mx/jspui/handle/1002/1173
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7725929
dc.descriptionWe present local profile measurements of inner mirrorlike and external front-end polycarbonate surfaces at the same spot of assembled optical storage devices, a CD and a DVD, performed with a heterodyne scanning interferometer that uses Gaussian beams. We show that the heterodyne interferometer can reproduce the profiles of both surfaces with accurate precision. We describe a procedure for calibrating the instrument based on the measurement of reflecting calibrated gratings. To show the advantages that the heterodyne interferometer represents as a valuable tool for the characterization of optical disks, we include a comparison of experimental results obtained with a confocal microscope under similar working conditions.
dc.formatapplication/pdf
dc.rightsinfo:eu-repo/semantics/openAccess
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/4.0
dc.subjectinfo:eu-repo/classification/cti/1
dc.subjectinfo:eu-repo/classification/cti/1
dc.titleOverall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope
dc.typeinfo:eu-repo/semantics/article


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