dc.creator | Jorge Mauricio Flores Moreno | |
dc.creator | MOISES CYWIAK GARBARCEWICZ | |
dc.creator | FERNANDO MENDOZA SANTOYO | |
dc.date | 2009-12-23 | |
dc.date.accessioned | 2023-07-21T15:15:48Z | |
dc.date.available | 2023-07-21T15:15:48Z | |
dc.identifier | http://cio.repositorioinstitucional.mx/jspui/handle/1002/1173 | |
dc.identifier.uri | https://repositorioslatinoamericanos.uchile.cl/handle/2250/7725929 | |
dc.description | We present local profile measurements of inner mirrorlike and external front-end polycarbonate surfaces at the same spot of assembled optical storage devices, a CD and a DVD, performed with a heterodyne scanning interferometer that uses Gaussian beams. We show that the heterodyne interferometer can reproduce the profiles of both surfaces with accurate precision. We describe a procedure for calibrating the instrument based on the measurement of reflecting calibrated gratings. To show the advantages that the heterodyne interferometer represents as a valuable tool for the characterization of optical disks, we include a comparison of experimental results obtained with a confocal microscope under similar working conditions. | |
dc.format | application/pdf | |
dc.rights | info:eu-repo/semantics/openAccess | |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/4.0 | |
dc.subject | info:eu-repo/classification/cti/1 | |
dc.subject | info:eu-repo/classification/cti/1 | |
dc.title | Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope | |
dc.type | info:eu-repo/semantics/article | |