Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope

dc.creatorJESUS CANTU VALLE
dc.creatorFRANCISCO RUIZ ZEPEDA
dc.creatorFERNANDO MENDOZA SANTOYO
dc.creatorMIGUEL JOSE Y YACAMAN
dc.date2014-06-30
dc.dateinfo:eu-repo/date/embargoEnd/2019-06-30
dc.date.accessioned2023-07-21T15:15:03Z
dc.date.available2023-07-21T15:15:03Z
dc.identifierhttp://cio.repositorioinstitucional.mx/jspui/handle/1002/687
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7725470
dc.descriptionIn this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200 Fisshown. The objective dual-lens configuration allows adjusting the field of view from 35nm to 2.5 μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing(σ) and versus fringe width(W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses.
dc.formatapplication/pdf
dc.rightsinfo:eu-repo/semantics/embargoedAccess
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/4.0
dc.subjectinfo:eu-repo/classification/cti/1
dc.subjectinfo:eu-repo/classification/cti/1
dc.titleCalibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope
dc.typeinfo:eu-repo/semantics/article


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