dc.creatorDAVID ASAEL GUTIERREZ HERNANDEZ
dc.creatorCARLOS PEREZ LOPEZ
dc.creatorFERNANDO MENDOZA SANTOYO
dc.date2014-04
dc.dateinfo:eu-repo/date/embargoEnd/2019-04-30
dc.date.accessioned2023-07-21T15:15:03Z
dc.date.available2023-07-21T15:15:03Z
dc.identifierhttp://cio.repositorioinstitucional.mx/jspui/handle/1002/686
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7725469
dc.descriptionThe measurement of a surface profile by using High Speed Electronic Speckle Pattern Interferometry (HS-ESPI) is presented. It is realized by the temporal phase shifting algorithm proposed by Carré. The HS-ESPI is configured to 4000 frames per second (fps). Traditionally, temporal phase shifting techniques employed piezoelectric components to retrieve the optical phase of the measured object. In this work the retrieved optical phase comes directly from the object itself which is under a vibration condition. The measurement is done without the need of any piezoelectric component, any electronic synchronization or any other external component
dc.formatapplication/pdf
dc.rightsinfo:eu-repo/semantics/embargoedAccess
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/4.0
dc.subjectinfo:eu-repo/classification/cti/1
dc.subjectinfo:eu-repo/classification/cti/1
dc.titleApplication of the carré algorithm and high speed interferometer technique for fast surface profile measurement
dc.typeinfo:eu-repo/semantics/article


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