dc.creatorKumar, S.
dc.creatorPradhan, A.K.
dc.creatorKumar, U.
dc.creatorDhillon, G.S.
dc.creatorKaur, S.
dc.creatorNeeraj Budhlakoti
dc.creatorMishra, D.C.
dc.creatorSingh, A.K.
dc.creatorSingh, R.
dc.creatorKumari, J.
dc.creatorKumaran, V.V.
dc.creatorMishra, V.K.
dc.creatorBhati, P.
dc.creatorDas, S.
dc.creatorChand, R.
dc.creatorSingh, K.
dc.creatorKumar, S.
dc.date2023-01-06T01:00:14Z
dc.date2023-01-06T01:00:14Z
dc.date2022
dc.date.accessioned2023-07-17T20:09:59Z
dc.date.available2023-07-17T20:09:59Z
dc.identifierhttps://hdl.handle.net/10883/22366
dc.identifier10.1186/s12870-022-04013-w
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7514114
dc.descriptionBackground During the last few decades, the diverse sources of resistance, several genes and QTLs for spot blotch resistance have been identified. However, a large set of germplasm lines are still unexplored that have the potential to develop highly resistant wheat cultivars for the target environments. Therefore, the identification of new sources of resistance to spot blotch is essential for breeding programmes to develop spot blotch resistant cultivars and sustain wheat production. The association mapping panel of 294 diverse bread wheat accessions was used to explore new sources of spot blotch disease resistance and to identify genomic regions using genome wide association analysis (GWAS). The genotypes were tested in replicated trials for spot blotch disease at three major hot spots in India (Varanasi in UP, Pusa in Bihar, and Cooch Behar in West Bengal). The area under the disease progress curve (AUDPC) was calculated to assess the level of resistance in each genotype. Results A total of 19 highly and 76 moderately resistant lines were identified. Three accessions (EC664204, IC534306 and IC535188) were nearly immune to spot blotch disease. The genotyping of all accessions resulted in a total of 16,787 high-quality polymorphic SNPs. The GWAS was performed using a Compressed Mixed Linear Model (CMLM) and a Mixed Linear Model (MLM). A total of seven significant MTAs, common in both the models and consistent across the environment, were further validated to develop KASP markers. Four MTAs (AX-94710084, AX-94865722, AX-95135556, and AX-94529408) on three chromosomes (2AL, 2BL, and 3BL) have been successfully validated through the KASP marker. Conclusions The new source of resistance was identified from unexplored germplasm lines. The genomic regions identified through GWAS were validated through KASP markers. The marker information and the highly resistant sources are valuable resources to rapidly develop immune or near immune wheat varieties.
dc.languageEnglish
dc.publisherBioMed Central
dc.relationhttps://bmcplantbiol.biomedcentral.com/articles/10.1186/s12870-022-04013-w#Sec19
dc.relationNutrition, health & food security
dc.relationPlant Health
dc.relationGenetic Innovation
dc.relationDepartment of Biotechnology, India
dc.relationhttps://hdl.handle.net/10568/129204
dc.rightsCIMMYT manages Intellectual Assets as International Public Goods. The user is free to download, print, store and share this work. In case you want to translate or create any other derivative work and share or distribute such translation/derivative work, please contact CIMMYT-Knowledge-Center@cgiar.org indicating the work you want to use and the kind of use you intend; CIMMYT will contact you with the suitable license for that purpose
dc.rightsOpen Access
dc.source22
dc.source1471-2229
dc.sourceBMC Plant Biology
dc.source618
dc.subjectAGRICULTURAL SCIENCES AND BIOTECHNOLOGY
dc.subjectSpot Blotch
dc.subjectGenome-Wide Association Study
dc.subjectMarker Trait Association
dc.subjectKASP Markers
dc.subjectKompetitive Allele Specific PCR
dc.subjectTRITICUM AESTIVUM
dc.subjectMATERIAL TRANSFER AGREEMENTS
dc.subjectMARKER-ASSISTED SELECTION
dc.subjectDISEASE RESISTANCE
dc.subjectWHEAT
dc.titleValidation of Novel spot blotch disease resistance alleles identified in unexplored wheat (Triticum aestivum L.) germplasm lines through KASP markers
dc.typeArticle
dc.typePublished Version
dc.coverageLondon (United Kingdom)


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