Genome-wide association study for spot blotch resistance in synthetic hexaploid wheat

dc.creatorLozano-Ramirez, N.
dc.creatorDreisigacker, S.
dc.creatorSansaloni, C.
dc.creatorXinyao He
dc.creatorSandoval-Islas, S.
dc.creatorPerez-Rodriguez, P.
dc.creatorCarballo-Carballo, A.
dc.creatorNava Díaz, C.
dc.creatorKishii, M.
dc.creatorSingh, P.K.
dc.date2022-09-27T00:20:13Z
dc.date2022-09-27T00:20:13Z
dc.date2022
dc.date.accessioned2023-07-17T20:09:29Z
dc.date.available2023-07-17T20:09:29Z
dc.identifierhttps://hdl.handle.net/10883/22198
dc.identifier10.3390/genes13081387
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7513953
dc.descriptionSpot blotch (SB) caused by Bipolaris sorokiniana (Sacc.) Shoem is a destructive fungal disease affecting wheat and many other crops. Synthetic hexaploid wheat (SHW) offers opportunities to explore new resistance genes for SB for introgression into elite bread wheat. The objectives of our study were to evaluate a collection of 441 SHWs for resistance to SB and to identify potential new genomic regions associated with the disease. The panel exhibited high SB resistance, with 250 accessions showing resistance and 161 showing moderate resistance reactions. A genome-wide association study (GWAS) revealed a total of 41 significant marker-trait associations for resistance to SB, being located on chromosomes 1B, 1D, 2A, 2B, 2D, 3A, 3B, 3D, 4A, 4D, 5A, 5D, 6D, 7A, and 7D; yet none of them exhibited a major phenotypic effect. In addition, a partial least squares regression was conducted to validate the marker-trait associations, and 15 markers were found to be most important for SB resistance in the panel. To our knowledge, this is the first GWAS to investigate SB resistance in SHW that identified markers and resistant SHW lines to be utilized in wheat breeding.
dc.languageEnglish
dc.publisherMDPI
dc.relationhttps://www.mdpi.com/2073-4425/13/8/1387#supplementary
dc.relationNutrition, health & food security
dc.relationEnvironmental health & biodiversity
dc.relationAccelerated Breeding
dc.relationGenebanks
dc.relationGenetic Innovation
dc.relationCGIAR Research Program on Wheat
dc.relationUnited States Agency for International Development
dc.relationAccelerating Genetic Gains Project
dc.relationhttps://hdl.handle.net/10568/126601
dc.rightsCIMMYT manages Intellectual Assets as International Public Goods. The user is free to download, print, store and share this work. In case you want to translate or create any other derivative work and share or distribute such translation/derivative work, please contact CIMMYT-Knowledge-Center@cgiar.org indicating the work you want to use and the kind of use you intend; CIMMYT will contact you with the suitable license for that purpose
dc.rightsOpen Access
dc.source8
dc.source13
dc.source2073-4425
dc.sourceGenes
dc.source1387
dc.subjectAGRICULTURAL SCIENCES AND BIOTECHNOLOGY
dc.subjectSpot Blotch
dc.subjectGenome-Wide Association Study
dc.subjectSynthetic Hexaploid Wheat
dc.subjectPartial Least Squares Regression
dc.subjectFOLIAR DISEASES
dc.subjectBIPOLARIS SOROKINIANA
dc.subjectFUNGAL DISEASES
dc.subjectDISEASE RESISTANCE
dc.subjectWHEAT
dc.titleGenome-wide association study for spot blotch resistance in synthetic hexaploid wheat
dc.typeArticle
dc.typePublished Version
dc.coverageBasel (Switzerland)


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