dc.creatorHerrera-Foessel, S.A.
dc.creatorSingh, R.P.
dc.creatorHuerta-Espino, J.
dc.creatorCrossa, J.
dc.creatorYuen, J.
dc.creatorDjurle, A.
dc.date2013-06-07T21:11:52Z
dc.date2013-06-07T21:11:52Z
dc.date2006
dc.date.accessioned2023-07-17T19:56:50Z
dc.date.available2023-07-17T19:56:50Z
dc.identifier0191-2917
dc.identifier1943-7692
dc.identifierhttp://hdl.handle.net/10883/2494
dc.identifier10.1094/PD-90-1065
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7508880
dc.descriptionLeaf rust, caused by Puccinia triticina, is an important disease of durum wheat (Triticum turgidum) in many countries. We compared the effectiveness of different types of resistance in International Maize and Wheat Improvement Center-derived durum wheat germ plasm for protecting grain yield and yield traits. In all, 10 durum wheat lines with race-specific resistance, 18 with slow-rusting resistance, and 2 susceptible were included in two yield loss trials sown on different planting dates in Mexico with and without fungicide protection under high disease pressure. Eight genotypes with race-specific resistance were immune to leaf rust. Durum wheat lines with slow-rusting resistance displayed a range of severity responses indicating phenotypic diversity. Mean yield losses for susceptible, race-specific, and slow-rusting genotypes were 51, 5, and 26%, respectively, in the normal sowing date trial and 71, 11, and 44% when sown late. Yield losses were associated mainly with a reduction in biomass, harvest index, and kernels per square meter. Slow-rusting durum wheat lines with low disease levels and low yield losses, as well as genotypes with low yield losses despite moderate disease levels, were identified. Such genotypes can be used for breeding durum wheat genotypes with higher levels of resistance and negligible yield losses by using strategies that previously have been shown to be successful in bread wheat.
dc.description1065-1072
dc.formatPDF
dc.languageEnglish
dc.publisherAmerican Phytopathological Society (APS)
dc.rightsCIMMYT manages Intellectual Assets as International Public Goods. The user is free to download, print, store and share this work. In case you want to translate or create any other derivative work and share or distribute such translation/derivative work, please contact CIMMYT-Knowledge-Center@cgiar.org indicating the work you want to use and the kind of use you intend; CIMMYT will contact you with the suitable license for that purpose.
dc.rightsOpen Access
dc.source8
dc.source90
dc.sourcePlant Disease
dc.subjectAGRICULTURAL SCIENCES AND BIOTECHNOLOGY
dc.subjectWHEAT
dc.subjectRUSTS
dc.subjectYIELDS
dc.subjectGENOTYPES
dc.subjectDISEASE RESISTANCE
dc.subjectRESEARCH ORGANIZATIONS
dc.subjectGERMPLASM
dc.titleEffect of leaf rust on grain yield and yield traits of durum wheats with race-specific and slow-rusting resistance to leaf rust
dc.typeArticle


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