Development and Evaluation of a Leaf Disease Damage Extension in Cropsim-CERES Wheat

dc.creatorRöll, Georg
dc.creatorBatchelor, William
dc.creatorCastro, Ana Carolina
dc.creatorSimón, María Rosa
dc.creatorGraeff-Hönninger, Simone
dc.date2019
dc.date2021-09-22T16:22:29Z
dc.date.accessioned2023-07-15T03:22:02Z
dc.date.available2023-07-15T03:22:02Z
dc.identifierhttp://sedici.unlp.edu.ar/handle/10915/125384
dc.identifierhttps://www.mdpi.com/2073-4395/9/3/120
dc.identifierissn:2073-4395
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7465440
dc.descriptionDeveloping disease models to simulate and analyse yield losses for various pathogens is a challenge for the crop modelling community. In this study, we developed and tested a simple method to simulate septoria tritici blotch (STB) in the Cropsim-CERES Wheat model studying the impacts of damage on wheat (Triticum aestivum L.) yield. A model extension was developed by adding a pest damage module to the existing wheat model. The module simulates the impact of daily damage on photosynthesis and leaf area index. The approach was tested on a two-year dataset from Argentina with different wheat cultivars. The accuracy of the simulated yield and leaf area index (LAI) was improved to a great extent. The Root mean squared error (RMSE) values for yield (1144 kg ha⁻¹) and LAI (1.19 m2 m⁻²) were reduced by half (499 kg ha⁻¹) for yield and LAI (0.69 m² m⁻²). In addition, a sensitivity analysis of different disease progress curves on leaf area index and yield was performed using a dataset from Germany. The sensitivity analysis demonstrated the ability of the model to reduce yield accurately in an exponential relationship with increasing infection levels (0–70%). The extended model is suitable for site specific simulations, coupled with for example, available remote sensing data on STB infection.
dc.descriptionFacultad de Ciencias Agrarias y Forestales
dc.descriptionComisión de Investigaciones Científicas de la provincia de Buenos Aires
dc.formatapplication/pdf
dc.languageen
dc.rightshttp://creativecommons.org/licenses/by/4.0/
dc.rightsCreative Commons Attribution 4.0 International (CC BY 4.0)
dc.subjectCiencias Agrarias
dc.subjectWheat
dc.subjectDisease
dc.subjectYield
dc.subjectSeptoria tritici blotch
dc.subjectLeaf area index
dc.subjectCrop modelling
dc.subjectDecision support system for agrotechnology transfer (DSSAT)
dc.subjectCropsim-CERES Wheat
dc.titleDevelopment and Evaluation of a Leaf Disease Damage Extension in Cropsim-CERES Wheat
dc.typeArticulo
dc.typeArticulo


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