Statistical analysis of a mixed-layer x-ray diffraction peak

dc.creatorRebollo Neira, Laura
dc.creatorConstantinides, Anthony G.
dc.creatorPlastino, Ángel Luis
dc.creatorÁlvarez, Alberto Guillermo
dc.creatorBonetto, Rita Dominga
dc.creatorIñíguez Rodríguez, Adrián Mario
dc.date1997-09-07
dc.date2021-08-18T15:20:21Z
dc.date.accessioned2023-07-15T02:42:54Z
dc.date.available2023-07-15T02:42:54Z
dc.identifierhttp://sedici.unlp.edu.ar/handle/10915/122878
dc.identifierissn:0022-3727
dc.identifierissn:1361-6463
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7463000
dc.descriptionA mathematical model to describe the line shape of an x-ray diffraction peak from stacks of different layers such as, for instance, an interstratified clay mineral has been evolved. The aim was to be able to analyse the proportions of different specific stacking sequences in two-component interstratified samples. A maximum-entropy algorithm was applied to observed powder-diffraction intensities in order to obtain the probability of each stacking sequence. Application to natural smectite-illite clays gave reasonable results.
dc.descriptionFacultad de Ciencias Exactas
dc.descriptionCentro de Investigación y Desarrollo en Ciencias Aplicadas
dc.descriptionCentro de Investigaciones Geológicas
dc.formatapplication/pdf
dc.format2462-2469
dc.languageen
dc.rightshttp://creativecommons.org/licenses/by-nc-sa/4.0/
dc.rightsCreative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)
dc.subjectCiencias Exactas
dc.subjectMixed layer
dc.subjectLine (formation)
dc.subjectChemistry
dc.subjectMineralogy
dc.subjectDiffraction
dc.subjectIllite
dc.subjectStacking
dc.subjectClay minerals
dc.subjectX-ray crystallography
dc.subjectMathematical model
dc.titleStatistical analysis of a mixed-layer x-ray diffraction peak
dc.typeArticulo
dc.typeArticulo


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