| dc.contributor | Krug, Margrit Reni | |
| dc.creator | Kondo, Elcio | |
| dc.date.accessioned | 2017-05-25T12:10:45Z | |
| dc.date.accessioned | 2022-09-22T19:25:14Z | |
| dc.date.accessioned | 2023-03-13T20:53:49Z | |
| dc.date.available | 2017-05-25T12:10:45Z | |
| dc.date.available | 2022-09-22T19:25:14Z | |
| dc.date.available | 2023-03-13T20:53:49Z | |
| dc.date.created | 2017-05-25T12:10:45Z | |
| dc.date.created | 2022-09-22T19:25:14Z | |
| dc.date.issued | 2017-01-11 | |
| dc.identifier | https://hdl.handle.net/20.500.12032/60670 | |
| dc.identifier.uri | https://repositorioslatinoamericanos.uchile.cl/handle/2250/6176496 | |
| dc.description.abstract | Nowadays several electronic equipment are using NAND Flash memories to store data. These memories are controlled by an integrated circuit with an memory controller embedded that internally has a system to ensure the integrity of the stored information, that are known as Error Correction Codes (ECC). The ECCs are codes that can detect and correct errors by redundant bits added to information. Usually the ECC codes are implemented on NAND Flash memory controller as a hardware block. On this text ECC codes used by industry, the Hamming code, BCH (Bose-Chaudhuri-Hocquenghem) and Reed-solomon codes were compared.Systemically compare between selected ECCs were done and selected two codes (BCH and Hamming), which were described in VHDL language and allowed to identify the best code with better economical advantage for NAND Flash memories. | |
| dc.publisher | Universidade do Vale do Rio dos Sinos | |
| dc.rights | openAccess | |
| dc.subject | ECC | |
| dc.subject | Reed-Solomon | |
| dc.title | Estudo comparativo de algoritmos de ECC aplicados à memória NAND Flash | |
| dc.type | Dissertação | |
