dc.contributorUniversidade Estadual Paulista (UNESP)
dc.date.accessioned2022-05-02T18:01:45Z
dc.date.accessioned2022-12-20T03:53:12Z
dc.date.available2022-05-02T18:01:45Z
dc.date.available2022-12-20T03:53:12Z
dc.date.created2022-05-02T18:01:45Z
dc.date.issued2016-10-01
dc.identifierIEEE Transactions on Dielectrics and Electrical Insulation, v. 23, n. 5, p. 3053-3060, 2016.
dc.identifier1070-9878
dc.identifierhttp://hdl.handle.net/11449/234472
dc.identifier10.1109/TDEI.2016.7736869
dc.identifier2-s2.0-84997693909
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/5414568
dc.description.abstractThis paper presents results of the spectrum of energy of secondary electrons for the energies of perpendicularly incident electrons of 0.4 keV, 2.0 keV, or 3.5 keV in a gold surface deposited on a substratum of Teflon-FEP. Two samples of Teflon-FEP (50 nm) were used with deposition by sputtering gold layers with thicknesses of 2.5 nm and 50 nm. The results show that the energy distribution depends on the energy of irradiation for the sample with the 2.5 nm gold layer, while no significant difference was observed for the sample with the 50 nm layer.
dc.languageeng
dc.relationIEEE Transactions on Dielectrics and Electrical Insulation
dc.sourceScopus
dc.subjectcrossover points
dc.subjectelectron accelerator
dc.subjectelectron beam
dc.subjectemission yields
dc.subjectenergy distribution of secondary
dc.subjectgold
dc.subjectpolymers
dc.subjectSecondary electron emission
dc.subjectspectrum of energy of secondary
dc.subjectTeflon-FEP
dc.titleEnergy distribution of secondary electrons from gold on teflon-FEP
dc.typeArtículos de revistas


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