Atomic Force Microscopy: A Powerful Tool for Electrical Characterization

dc.contributorUniversidade Estadual Paulista (UNESP)
dc.contributorUniversidade Federal de São Carlos (UFSCar)
dc.date.accessioned2022-04-30T05:15:59Z
dc.date.accessioned2022-12-20T03:31:06Z
dc.date.available2022-04-30T05:15:59Z
dc.date.available2022-12-20T03:31:06Z
dc.date.created2022-04-30T05:15:59Z
dc.date.issued2017-03-23
dc.identifierNanocharacterization Techniques, p. 37-64.
dc.identifierhttp://hdl.handle.net/11449/232701
dc.identifier10.1016/B978-0-323-49778-7.00002-3
dc.identifier2-s2.0-85040575407
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/5412794
dc.description.abstractThe fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various scientific fields. Several techniques derived from this microscopy have appeared in recent years, providing additional information to the topographical images and enabling the investigation of chemical and physical properties of materials. This chapter will address the concepts and principles of AFM, as well as various aspects related to electrical nanocharacterization, using specific techniques such as electrostatic force microscopy (EFM) and scanning surface potential microscopy (SSPM).
dc.languageeng
dc.relationNanocharacterization Techniques
dc.sourceScopus
dc.subjectAtomic force microscopy
dc.subjectElectrostatic force microscopy (EFM)
dc.subjectIntermittent contact
dc.subjectNanocharacterization
dc.subjectSpatial resolution
dc.subjectTopographical image
dc.titleAtomic Force Microscopy: A Powerful Tool for Electrical Characterization
dc.typeCapítulos de libros


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