Probing free-carrier recombination in silicon strip nano-waveguides

dc.contributorUniversidade Estadual de Campinas (UNICAMP)
dc.contributorUniversidade de São Paulo (USP)
dc.contributorMackenzie Presbyterian University
dc.date.accessioned2022-04-28T19:09:24Z
dc.date.accessioned2022-12-20T01:07:36Z
dc.date.available2022-04-28T19:09:24Z
dc.date.available2022-12-20T01:07:36Z
dc.date.created2022-04-28T19:09:24Z
dc.date.issued2018-01-01
dc.identifierOptics InfoBase Conference Papers, v. Part F93-CLEO_QELS 2018.
dc.identifierhttp://hdl.handle.net/11449/221101
dc.identifier10.1364/CLEO_QELS.2018.FF1E.8
dc.identifier2-s2.0-85048930166
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/5401229
dc.description.abstractWe analyze recombination dynamics of photo-generated free-carriers in strip silicon nanowaveguides, revealing a highly nonlinear decay dynamics with a time-dependent lifetime ranging from ~800 ps at the beginning to ~300 ns at the end of the decay.
dc.languageeng
dc.relationOptics InfoBase Conference Papers
dc.sourceScopus
dc.titleProbing free-carrier recombination in silicon strip nano-waveguides
dc.typeActas de congresos


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