Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0001) surface

dc.contributorjmoranm@uni.edu.pe
dc.contributorjacques.cousty@cea.fr
dc.creatorVillegas Rosales, Kevin Amilcar
dc.creatorMorán Meza, José Antonio
dc.creatorLubin, Christophe
dc.creatorThoyer, F.
dc.creatorVillegas Rosales, Kevin Amilcar
dc.creatorGutarra Espinoza, Abel Aurelio
dc.creatorMartin, F.
dc.creatorCousty, Jacques
dc.date2017-08-14T16:05:37Z
dc.date2017-08-14T16:05:37Z
dc.date2015-05
dc.date.accessioned2022-12-06T19:44:11Z
dc.date.available2022-12-06T19:44:11Z
dc.identifier0008-6223
dc.identifierhttp://hdl.handle.net/20.500.14076/4145
dc.identifierCarbon
dc.identifier10.1016/j.carbon.2015.01.050
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/5277331
dc.descriptionThe fabrication of ultra-sharp tips from carbon fiber (CF), which are mounted on a qPlus probe for combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM) experiments, is reported. The carbon fiber tips were electrochemically etched in a KOH or NaOH solution, using different electronic devices. CF tips with an apex radius ∼10 nm, as deduced from the measured slopes of the Fowler–Nordheim plots (kR < 70 nm for k ∼ 6), were routinely obtained with a homemade electronic device that controls the intensity of the etching current. Then, these conductive CF tips were also characterized by imaging the 6H-SiC(0 0 0 1) surface covered by an epitaxial graphene layer in ultra-high vacuum (UHV). The lattice of the R30° reconstruction was regularly imaged by STM working either in non-oscillating mode or in dynamic mode, which also maps the variations of the force gradient. From these measurements with a constant mean-tunneling-current of 20 pA, it was found that the STM tip suffered variations of the tip/surface force gradient in between 8.25 and 16.50 N/m when it scanned the epitaxial graphene layer on the reconstructed 6H-SiC(0 0 0 1) surface.
dc.formatapplication/pdf
dc.languageeng
dc.publisherElsevier Ltd
dc.relationhttp://www.sciencedirect.com/science/article/pii/S0008622315000755
dc.rightsinfo:eu-repo/semantics/restrictedAccess
dc.rightshttp://creativecommons.org/licenses/by/4.0/
dc.sourceUniversidad Nacional de Ingeniería
dc.sourceRepositorio Institucional - UNI
dc.subjectCarbon fiber (CF)
dc.subjectScanning Tunneling Microscopy (STM)
dc.subjectFrequency modulation atomic force microscopy (FM-AFM)
dc.titleFabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0001) surface
dc.typeArtículos de revistas


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