High resolution X-Ray diffraction analysis of InGaAs/InP superlattices

dc.creatorCornet, D. M.
dc.creatorLaPierre, R. R
dc.creatorPusep, Yu A.
dc.creatorComedi, David Mario
dc.date.accessioned2019-10-11T13:37:31Z
dc.date.accessioned2022-10-15T15:07:44Z
dc.date.available2019-10-11T13:37:31Z
dc.date.available2022-10-15T15:07:44Z
dc.date.created2019-10-11T13:37:31Z
dc.date.issued2006-12
dc.identifierCornet, D. M.; LaPierre, R. R; Pusep, Yu A.; Comedi, David Mario; High resolution X-Ray diffraction analysis of InGaAs/InP superlattices; American Institute of Physics; Journal of Applied Physics; 100; 12-2006; 1-6
dc.identifier0021-8979
dc.identifierhttp://hdl.handle.net/11336/85672
dc.identifierCONICET Digital
dc.identifierCONICET
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/4400661
dc.description.abstractThe interfacial properties of lattice-matched InGaAs/InP superlattice (SL) structures grown by gas source molecular beam epitaxy were investigated by high resolution x-ray diffraction (HRXRD). SLs with various periods were grown to determine the contributions of the interface layers to the structural properties of the SLs. The HRXRD curves exhibited a number of features indicative of interfacial layers, including weak even-order satellite peaks, and a zero-order diffraction peak that shifted toward lower diffraction angles with decreasing SL period. A detailed structural model is proposed to explain these observations, consisting of strained InAsP and InGaAsP monolayers due to the group-V gas switching and atomic exchange at the SL interfaces.
dc.languageeng
dc.publisherAmerican Institute of Physics
dc.relationinfo:eu-repo/semantics/altIdentifier/doi/https://dx.doi.org/10.1063/1.2335689
dc.relationinfo:eu-repo/semantics/altIdentifier/url/https://aip.scitation.org/doi/10.1063/1.2335689
dc.rightshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectInGaAs/InP
dc.subjectsuperlattice
dc.subjectX-ray diffraction
dc.subjectInGaAsP
dc.titleHigh resolution X-Ray diffraction analysis of InGaAs/InP superlattices
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:ar-repo/semantics/artículo
dc.typeinfo:eu-repo/semantics/publishedVersion


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