dc.creatorMoreno López, Juan Carlos
dc.creatorRuano Sandoval, Gustavo Daniel
dc.creatorFerron, Julio
dc.creatorAyala, Paola
dc.creatorPasseggi, Mario Cesar Guillermo
dc.date.accessioned2019-10-15T13:43:12Z
dc.date.accessioned2022-10-15T08:34:40Z
dc.date.available2019-10-15T13:43:12Z
dc.date.available2022-10-15T08:34:40Z
dc.date.created2019-10-15T13:43:12Z
dc.date.issued2018-12
dc.identifierMoreno López, Juan Carlos; Ruano Sandoval, Gustavo Daniel; Ferron, Julio; Ayala, Paola; Passeggi, Mario Cesar Guillermo; Thermally Annealed Sub-Monolayers of AlF3 on Cu(100): An STM and XPS Study; Wiley VCH Verlag; Physica Status Solidi B-basic Research; 255; 12; 12-2018; 18003891-18003895
dc.identifier0370-1972
dc.identifierhttp://hdl.handle.net/11336/85869
dc.identifierCONICET Digital
dc.identifierCONICET
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/4365588
dc.description.abstractA steady and durable transition from rough and randomly oriented 2D aluminum fluoride clusters to ultra-thin films with defined arrangement is here reported. Scanning tunneling microscopy images show that the material deposited on top of Cu(100) reveals a smooth surface with a preferential arrangement and a transition in the morphology of the islands after performing a post-deposition annealing treatment at 575 K. X-ray photoelectron spectroscopy shows that the chemical environment of fluoride atoms remains unaltered after performing annealing treatments at this temperature. However, the tunneling voltage used to acquire STM images of the films changes from typical insulator values to metallic-like ones after annealing. These results suggest an important change in the local density of states of the aluminum fluoride islands after the post-deposition annealing treatment.
dc.languageeng
dc.publisherWiley VCH Verlag
dc.relationinfo:eu-repo/semantics/altIdentifier/url/https://onlinelibrary.wiley.com/doi/10.1002/pssb.201800389
dc.relationinfo:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1002/pssb.201800389
dc.rightshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.rightsinfo:eu-repo/semantics/restrictedAccess
dc.subjectALUMINUM FLUORIDE
dc.subjectSCANNING TUNNELING MICROSCOPY
dc.subjectTHIN-FILMS GROWTH
dc.subjectX-RAY PHOTOELECTRON SPECTROSCOPY
dc.titleThermally Annealed Sub-Monolayers of AlF3 on Cu(100): An STM and XPS Study
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:ar-repo/semantics/artículo
dc.typeinfo:eu-repo/semantics/publishedVersion


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