Absorptance homogeneity and its relaxation in thin films by photothermal microscopy

dc.creatorZaldivar Escola, Facundo
dc.creatorMingolo, Nelida
dc.creatorMartinez, Oscar Eduardo
dc.creatorRocca, Jorge J.
dc.creatorMenoni, Carmen S.
dc.date.accessioned2022-07-12T13:00:19Z
dc.date.accessioned2022-10-15T03:52:12Z
dc.date.available2022-07-12T13:00:19Z
dc.date.available2022-10-15T03:52:12Z
dc.date.created2022-07-12T13:00:19Z
dc.date.issued2019
dc.identifierAbsorptance homogeneity and its relaxation in thin films by photothermal microscopy; Optical Interference Coatings Conference; Santa Ana Pueblo; Estados Unidos; 2019; 1-3
dc.identifier978-1-943580-58-3
dc.identifierhttp://hdl.handle.net/11336/161856
dc.identifierCONICET Digital
dc.identifierCONICET
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/4342250
dc.description.abstractA photothermal microscope for absorptance homogeneity analysis is described. Absorptance maps with micrometer resolution and high sensitivity are obtained. Changes in absorptance are due to laser annealing of defects via one and two-photon processes.
dc.languageeng
dc.publisherOptical Society of America
dc.relationinfo:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/abstract.cfm?URI=OIC-2019-TE.2
dc.rightshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.rightsinfo:eu-repo/semantics/restrictedAccess
dc.sourceProceedings Optical Interference Coatings Conference
dc.subjectPhotothermal
dc.subjectMicroscopy
dc.subjectThin films
dc.subjectAbsorptance
dc.titleAbsorptance homogeneity and its relaxation in thin films by photothermal microscopy
dc.typeinfo:eu-repo/semantics/publishedVersion
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.typeinfo:ar-repo/semantics/documento de conferencia


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